Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-25T15:50:41.329Z Has data issue: false hasContentIssue false
  • English
  • Français

Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction

Published online by Cambridge University Press:  18 March 2011

Teresa Puig ,
Anna Puig-Molina ,
Narcís Mestres ,
Harm Van Seijen ,
Francesc Alsina ,
Juan C. González ,
Xavier Obradors ,
Heinz Graafsma ,
Alexander Usoskin  and
Herbert C. Freyhardt
Teresa Puig
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Anna Puig-Molina
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Narcís Mestres
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Harm Van Seijen
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Francesc Alsina
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Juan C. González
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Xavier Obradors
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Heinz Graafsma
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Alexander Usoskin
Affiliation:
Zentrum fuer Funktion Wekstoffe, Windausweg 2, D-37073 Goettingen, Germany
Herbert C. Freyhardt
Affiliation:
Zentrum fuer Funktion Wekstoffe, Windausweg 2, D-37073 Goettingen, Germany
Get access

Abstract

Two novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (μ-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 μm spatial resolution and acquisition times of 5 min/spot. In addition, synchrotron x-ray diffraction analysis in transmission geometry and 2D detectors enables, with acquisition times of 100 ms, simultaneous observation of a- and c- crystallites and in-plane textures of substrates, buffers and superconducting layer. Thus, opening the field of this technique to in-situ analysis of epitaxial growth of coated conductors prepared by ex-situ processes. Results from these two techniques for stainless steel tapes buffered with IBAD-YSZ and coated with PLD-YBCO are analyzed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 659: Symposium II – High-Temperature Superconductors-Crystal Chemistry, Processing & Properties , 2000 , II5.6
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Verebelyi, D.T., Christen, DF., Feenstra, R., Cantoni, C., Goyal, A., Lee, D.F., Paranthaman, M., Arendt, P.N., DePaula, D.F., Groves, J.R., Prouteau, C., Appl. Phys. Lett. 76, 1755 (2000)Google Scholar
[2] Kästner, G., Schäfer, C.. Senz, St-. Kaiser, T-, Hein, H.A., Lorenz, M., Hochmuth, H., Hesse, D., Supercond. Sic. Technol. 12, 3661 (1999)Google Scholar
[3] Usoskin, A., García-Moreno, F., Knoke, J., Sievers, S., Dzick, J., Freyhardt, H.C., Appl. Supercond. 1999, vol 1, pp 447, Inst Phys. Conf. Ser no 167 (2000)Google Scholar
[4] Cardona, M., Physica C 317–318, 30 (1999).Google Scholar
[5] Dieckmann, N., Kuersten, R., Loehndorf, M., Bock, A., Physica C 245, 212 (1995)Google Scholar