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Temperature Dependence of the Morphology of Thin Diblock Copolymer Films as Revealed by Neutron Reflectivity

Published online by Cambridge University Press:  21 February 2011

T. P. Russell ,
S. H. Anastasiadis ,
S. K. Satija  and
C. F. Majkrzak
T. P. Russell
Affiliation:
IBM Research Division, San Jose, CA
S. H. Anastasiadis
Affiliation:
IBM Research Division, San Jose, CA
S. K. Satija
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
C. F. Majkrzak
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
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Abstract

The order-disorder transition in thin films of symmetric diblock copolymers of polystyrene and polymethylmethacrylate has been investigated by neutron reflectivity. At temperatures above the order-disorder temperature, TMST, a surface induced oscillatory segment density profile with an exponential decay length, χ, is observed. The inverse of decay length 1/≤ TMST a lamellar morphology oriented parallel to the surface propagates through the entire specimen.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 166: Symposium J – Neutron Scattering for Materials Science , 1989 , 145
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

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[7] Russell, T. P.; Anastasiadis, S. H.; Satija, S. K. and Majkrzak, C. F. Phys. Rev. Lett. (submitted for publication).Google Scholar