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Temperature Controlled Scanning Nonlinear Dielectric Microscopy

Published online by Cambridge University Press:  01 February 2011

K. Ohara  and
Y. Cho
K. Ohara
Affiliation:
Research Institute of Electrical Communication, Tohoku Univ. 2–1–1 Katahira, Aoba-ku, Sendai, Japan
Y. Cho
Affiliation:
Research Institute of Electrical Communication, Tohoku Univ. 2–1–1 Katahira, Aoba-ku, Sendai, Japan
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Abstract

Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10−7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 803: Symposia GG/HH – Advanced Characterization Techniques for Data Storage Materials – Phase Change and Nonmagnetic Materials for Data Storage , 2003 , GG4.3
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

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