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A Tem study of Epitaxial FE/AG and MN/AG Superlattices

Published online by Cambridge University Press:  28 February 2011

S. Nahm ,
L. Salamanca — Riba ,
B. T. Jonker  and
G. A. Prinz
S. Nahm
Affiliation:
University of Maryland, College Park, MD 20742-2115
L. Salamanca — Riba
Affiliation:
Previously known as L. Salamanca-Young.
B. T. Jonker
Affiliation:
Naval Research Laboratory, Washington, DC 20375-5000.
G. A. Prinz
Affiliation:
Naval Research Laboratory, Washington, DC 20375-5000.
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Abstract

We have studied the epitaxial growth and structural properities of single crystal Fe/Ag and Mn/Ag superlattices grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the superlattice to obtain good quality films. For some samples an intermediate buffer layer of ZnSe was used, as well. Both Fe/Ag and Mn/Ag superlattices with a Ag buffer layer show very sharp interfaces. The densities of dislocations in the film and the buffer layer are the same suggesting that the dislocations originate at the film/substrate interface. We have observed evidence for a strain modulation of ≈ 8 Å in the Mn layer for thick (≈ 22 Å) Mn layers in the superlattice samples but not in samples with a thin Mn layer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 160 , 1989 , 209
Copyright
Copyright © Materials Research Society 1990

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