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Tem Characterization of Grain Boundaries in Mazed Bicrystal Films of Aluminum

Published online by Cambridge University Press:  15 February 2011

U. Dai-Men  and
K. H. Westmacott
U. Dai-Men
Affiliation:
National Center for Electron Microscopy, MSD, Lawrence Berkeley Laboratory, University of California, Berkeley, Ca. 94720
K. H. Westmacott
Affiliation:
National Center for Electron Microscopy, MSD, Lawrence Berkeley Laboratory, University of California, Berkeley, Ca. 94720
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Abstract

The structure and faceting behavior of near-90° <110> tilt grain boundaries in thin films of aluminum with a unique mazed bicrystal geometry is characterized by conventional, highresolution and high-voltage electron microscopy. In this microstructure the absence of triple junctions allows grain boundaries to facet in optimum orientation (inclination) during annealing. The degree of anisotropy of the boundaries is expressed in the form of a rose plot. Small local deviations in misorientation are shown to be necessary to accommodate optimum boundary segments. The crystallographic symmetry inherent in this microstructure is apparent and utilizedthroughout the analysis.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 229: Symposium Q – Structure/Property Relationships for Metal/Metal Interfaces , 1991 , 167
Copyright
Copyright © Materials Research Society 1991

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