Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T02:22:47.650Z Has data issue: false hasContentIssue false

Technique for Studying Overcurrent Behavior in YBCO Coated Conductors Using a Localized Magnetic Field

Published online by Cambridge University Press:  01 February 2011

J. Yates Coulter
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, NM, 87545U.S.A.
Stephen P. Ashworth
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, NM, 87545U.S.A.
Paul C. Dowden
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, NM, 87545U.S.A.
Jeffrey O. Willis
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, NM, 87545U.S.A.
Get access

Abstract

Over current stabilization of YBa2Cu30x (YBCO) coated conductor high temperature superconductor tape is required in most applications. The conductor must carry currents in excess of the critical current, Ic, without damage during over current events. Conductor damage is the result of joule heating and excessive temperature rise in regions with low Ic. We have developed and applied a measurement technique using a locally applied magnetic field with a high spatial gradient to define a small area over which the Ic is depressed. By measuring the voltage and temperature as a function of current, power dissipation and temperature rise were determined. Unstabilized conductors experienced thermal runaway and are easily damaged. Copper stabilizers applied by electroplating decreased dramatically the temperature rise and increased the level of power dissipation compared with the unstabilized conductor.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Kiss, T., Inoue, M. et al. , Physica C 392-396, 1053 (2003).Google Scholar
2 Foltyn, S.R., Arendt, P. N., Depaula, R.F., Dowden, P.C., Coulter, J.Y., Groves, J.R., Haussamen, L.N., Winston, L.P., Jia, Q.J., Maley, M.P., Physica C 341-348, 2305 (2000).Google Scholar
3 Matias, V., Gibbons, B., Civale, L. et al. , Superconductivity for Electric Systems 2004 Annual Peer Review, DOE/TD--000829824 CDGoogle Scholar
4 Selvamanickam, V., Reeves, J., and Peterson, D.E., Superconductivity for Electric Systems 2004 Annual Peer Review, DOE/TD--000829824 CDGoogle Scholar
5 Malozemoff, A.P., Rupich, M., and Schoop, U., Superconductivity for Electric Systems 2004 Annual Peer Review, DOE/TD--000829824 CDGoogle Scholar
6 Foltyn, S.R., Arendt, P. N., DePaula, R.F., Dowden, P.C., Coulter, J.Y., Groves, J.R., Maley, M.P., Peterson, D. E., IEEE Trans. Appl. Supercond. 9, 1519 (1999).Google Scholar
7 Wu, X.D., Foltyn, S.R., Arendt, P.N., Blumenthal, W.R., Campbell, I.H., Cotton, J.D., Coulter, J.Y., Hults, W.L., Maley, M.P., Safar, H.F., Smith, J.L., Appl. Phys. Lett. 16, 2397 (1995).Google Scholar
8 White, Guy K., Experimental Techniques in Low-Temperature Physics, 3rd Edition (Oxford University Press, Oxford, 1979) p. 319.Google Scholar