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Synthesis of Metal-doped Cryptomelane Nanomaterials using Cross-linking Reagents

Published online by Cambridge University Press:  11 February 2011

Jia Liu
Affiliation:
Institute of Materials Science, University of Connecticut, U-3136, Storrs, CT 06269–3136
Jun Cai
Affiliation:
Department of Chemistry, University of Connecticut, U-3060, Storrs, CT 06269–3060
Xiongfei Shen
Affiliation:
Institute of Materials Science, University of Connecticut, U-3136, Storrs, CT 06269–3136
Steven L. Suib*
Affiliation:
Institute of Materials Science, University of Connecticut, U-3136, Storrs, CT 06269–3136 Department of Chemistry, University of Connecticut, U-3060, Storrs, CT 06269–3060 Department of Chemical Engineering, University of Connecticut, U-3222, Storrs, CT 06269–3222
Mark Aindow
Affiliation:
Institute of Materials Science, University of Connecticut, U-3136, Storrs, CT 06269–3136 Department of Metallurgy and Materials Engineering, University of Connecticut, U-3136, Storrs, CT 06269–3136
*
Corresponding author: [email protected]
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Abstract

Three cross-linking reagents (PVA, glycerol and glucose) have successfully been used to synthesize non-doped and metal-doped nanosized cryptomelane materials via a solid-state preparation method. The 2×2 tunnel structure of cryptomelane was formed at 500 °C. FT-IR data show that no cross-linking reagent residues were found in the products after the reactions were complete at 800 °C. The metal dopants used were Fe, Ag, Co, Cu, Ni, and Zn. XRD data show that Fe and Co cations can be doped into the materials without the formation of additional phases. The tunnel structures of the nanosized materials exhibit long-range along the b axis, as indicated by transmission electron microscopy data. High-resolution scanning electron microscopy studies show that morphologies of the products are nanorods or nanofibers, depending on the cross-linking reagents used in the preparation. Thermogravimetric analyses indicate that these nanomaterials are thermally stable to 700 °C.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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