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Synthesis and Characterization of Copper (I) Chloride (CuCl) Nanocrystals in Conductive Polymer for UV Light Emitters

Published online by Cambridge University Press:  17 April 2019

M. M. Alam*
Affiliation:
Nanomaterials Processing Laboratory, School of Electronic Engineering, Dublin City University, Dublin 9, Ireland
F. Olabanji Lucas
Affiliation:
Nanomaterials Processing Laboratory, School of Electronic Engineering, Dublin City University, Dublin 9, Ireland
A. Cowley
Affiliation:
Nanomaterials Processing Laboratory, School of Electronic Engineering, Dublin City University, Dublin 9, Ireland
Karl Crowley
Affiliation:
School of Chemical Science, National Centre for Research, Dublin City University, Dublin 9, Ireland
S. Daniels
Affiliation:
Nanomaterials Processing Laboratory, School of Electronic Engineering, Dublin City University, Dublin 9, Ireland
K.V. Rajani
Affiliation:
Nanomaterials Processing Laboratory, School of Electronic Engineering, Dublin City University, Dublin 9, Ireland
P. J. McNally
Affiliation:
Nanomaterials Processing Laboratory, School of Electronic Engineering, Dublin City University, Dublin 9, Ireland
*
*Corresponding author. E-mail: [email protected]
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Abstract

Intrinsic γ-Copper (I) Chloride is an ionic I-VII compound semiconductor material with relatively low conductivity. To fabricate an efficient electroluminescent device based on CuCl nanocrystals (NC) the conductivity of the CuCl NC film should be relatively high. In order to improve the conductivity of CuCl films, nanocrystals were embedded in a highly conductive polymer (Polyaniline) and deposited on glass substrates via the spin-coating method. The deposited films were heated at 140°C for durations between 1 and 12 hours in vacuo. The room temperature UV-Vis absorption spectra for all CuCl films showed both Z1,2 and Z3 excitonic absorption features and the absorption intensity increased as the anneal time increased. Room temperature photoluminescence (PL) measurements of the hybrid films reveal very intense Z3 excitonic emission. Room temperature X-ray diffraction (XRD) confirmed the preferential growth of CuCl nanocrystals whose average size is ≈40 nm in the <111> orientation. Resistivity measurements were carried out using a four-point probe system, which confirmed that the resistivity of the composite film was ≈500 Ω/cm. This is an improvement when compared to the vacuum evaporated CuCl thin films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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