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Synthesis, Analysis, Transport and Field emission Measurements of Compound B-C-N Nanotubes

Published online by Cambridge University Press:  15 February 2011

Dmitri Golberg ,
Yoshio Bando ,
Pavel Dorozhkin ,
Zhen-Chao Dong ,
Cheng-Chun Tang ,
Keiji Kurashima  and
Masanori Mitome
Dmitri Golberg*
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Yoshio Bando
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Pavel Dorozhkin
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Zhen-Chao Dong
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Cheng-Chun Tang
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Keiji Kurashima
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
Masanori Mitome
Affiliation:
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan
*
*corresponding author. E-mail: [email protected]
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Abstract

Multiwalled B-C-N nanotubes of various morphologies and chemical compositions were synthesized by reacting C-based nanotube templates with boron oxide and nitrogen at 1573 K- 2173 K. The nanotubes were thoroughly analysed using a high-resolution field-emission 300 kV transmission electron microscope (TEM), an energy-filtered field-emission 300 kV electron microscope (Omega filter), an electron energy loss spectrometer and an energy dispersion X-ray detector. Transport and field emission properties of the nanotubes were studied using a low energy electron point source microscope and via in-situ measurements in TEM equipped with a scanning tunnelling microscope (STM) unit.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 772: Symposium M – Nanotube-Based Devices , 2003 , M7.6
Copyright
Copyright © Materials Research Society 2003

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Footnotes

1

Present address:Institute of Solid State Physics,ChernogolovkaMoscow Reg. 142432, Russia

References

1. Weng-Sieh, Z., Cherrey, K., Chopra, N.G., Blase, X., Miyamoto, Y., Rubio, A., Cohen, M.L., Louie, S.G., Zettl, A. and Gronsky, R., Phys. Rev. B 51, 111229 (1995)Google Scholar
2. Stephan, O., Ajayan, P.M., Colliex, C., Redlich, Ph., Lambert, J.M., Bernier, P. and Lefin, P., Science 266, 1683 (1994)Google Scholar
3. Carroll, D.L., Redlich, Ph., Blase, X., Charlier, J.-C., Curran, S., Ajayan, P.M., Roth, S. and Ruhle, M., Phys. Rev. Lett. 81, 2332 (1998)Google Scholar
4. Suenaga, K., Yudasaka, M., Colliex, C. and Iijima, S., Chem. Phys. Lett. 316, 365 (2000)Google Scholar
5. Han, W.Q., Mickelson, W., Cumings, J. and Zettl, A., Appl. Phys. Lett. 81, 1110 (2002)Google Scholar
6. Cumings, J. and Zettl, A.: in Electronic Properties of Molecular Nanostructures, edited by Kuzmany, H., Fink, J., Roth, S and Mayer, J. (AIP Conf. Proc. Ser. 2001, NY) pp. 577–580.Google Scholar
7. Golberg, D., Dorozhkin, P., Bando, Y., Hasegawa, M. and Dong, Z.-C., Chem. Phys. Lett. 359, 220 (2002)Google Scholar
8. Dorozhkin, P., Golberg, D., Bando, Y. and Dong, Z.-C., Appl. Phys. Lett. 81, 1083 (2002)Google Scholar
9. Golberg, D., Bando, Y., Mitome, M., Kurashima, K., Grobert, N., Reyes-Reyes, M., Terrones, H., and Terrones, M., Chem. Phys. Lett. 360, 1 (2002)Google Scholar
10. Golberg, D., Dorozhkin, P. S., Bando, Y., Dong, Z.-C., Tang, C.-C., Uemura, Y., Grobert, N., Reyes-Reyes, M., Terrones, H. and Terrones, M., Appl. Phys. A 76, 499 (2003)Google Scholar
11. Wildoer, J.W.G., Venema, L.C., Rinzler, A.G., Smalley, R.E. and Dekker, C., Nature 391, 59 (1998)Google Scholar
12. Blase, X., Rubio, A., Louie, S.G. and Cohen, M.L., Europhys. Lett. 28, 335 (1994)Google Scholar
13. Blase, X., Charlie, J.-C., Vita, A. De and Car, R., Appl. Phys. A 68, 293 (1999)Google Scholar
14. Dorozhkin, P., Nejoh, H. and Fujita, D., Vac. Sci. Techn. B 20, 1044 (2002)Google Scholar
15. Golberg, D., Dorozhkin, P., Bando, Y., Dong, Z.-C., Grobert, N., Reyes-Reyes, M., Terrones, H. and Terrones, M., Appl. Phys. Lett. 82, 1275 (2003)Google Scholar
16. Golberg, D., Mitome, M., Kurashima, K. and Bando, Y., J. Electr. Microscopy (2003) in press.Google Scholar