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Synchrotron White Radiation X-Ray Topographic Investigation of Dislocation Configurations Developed in Indium Antimonide Single Crystals by Plastic Bending

Published online by Cambridge University Press:  15 February 2011

Jun Wu  and
M. Dudley
Jun Wu
Affiliation:
Department of Materials Science and Engineering, SUNY Stony Brook, NY 11794-2275
M. Dudley
Affiliation:
Department of Materials Science and Engineering, SUNY Stony Brook, NY 11794-2275
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Abstract

Synchrotron white beam x-ray topography has been used to study dislocation configurations induced in InSb single crystals by three point bending at temperatures above the brittle to ductile transition point. Semi-hexagonal dislocation loops with one long screw segment and two outcropping 60° segments, single 60° B(g) dislocation kinks on screw dislocations, and screw dislocation dipoles were observed. The relationship between these observed defect structures and the mobilities of A(g), B(g), and screw dislocations in InSb, which appear to control the plastic behavior of crystals with the sphalerite structure, is discussed. Dislocation interactions and their role in the plastic deformation process are also addressed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 231
Copyright
Copyright © Materials Research Society 1993

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References

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