Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-27T02:11:40.408Z Has data issue: false hasContentIssue false
  • English
  • Français

Synchrotron Radiation Diffraction Imaging Study of the Magnetoacoustically Induced X-Ray Focusing Effect in FeBO3

Published online by Cambridge University Press:  10 February 2011

I. Matsouli ,
V. V. Kvardakov ,
J. I. Espeso ,
L. Chabert  and
J. Baruchel
I. Matsouli
Affiliation:
ESRF, BP 220, Grenoble 38043, France, [email protected] University of Warwick, Coventry, CV4 7AL, UK
V. V. Kvardakov
Affiliation:
Kurchatov Institute of Atomic Energy, Moscow 123182, Russia
J. I. Espeso
Affiliation:
ESRF, BP 220, Grenoble 38043, France Universidad de Cantabria, Santander, Spain
L. Chabert
Affiliation:
ESRF, BP 220, Grenoble 38043, France
J. Baruchel
Affiliation:
ESRF, BP 220, Grenoble 38043, France
Get access

Abstract

Synchrotron radiation diffraction imaging (‘topography’) was used at the ESRF to visualize ultrasonic standing waves in a magnetoacoustically excited FeBO3 crystal. Images were recorded at long sample-to-film distances (up to 1.5 m) without substantial loss of resolution. The resonant patterns reveal that the crystal acts as a pulsed X-ray focusing lens and strongly depend on both the amplitude of the magnetic field and the sample-to-detector distance. Different resonant frequencies can also lead to more complicated images due to interference effects of several vibrating modes present in the crystal. A model is proposed followed by a numerical integration which predicts the focusing of the X-ray beam and demonstrates the agreement between theory and experiment. This effect could be used to simultaneously monochromatize and focus the X-ray beam.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 59
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Ozhogin, V I, Preobrazhenskif, V L, Soy. Phys. Usp. 31(8), p. 713–729, 1988.Google Scholar
[2] Diehl, R, Jantz, W, Noiling, B I, Wettling, W in Current Topics in Material Science, Vol.11, Ch. 3, 1984.Google Scholar
[3] Kvardakov, V V, Somenkov, V A, J. Moscow Phys. Soc. 1, p. 33–57, 1991.Google Scholar
[4] Kvardakov, V V, Somenkov, V A, Tyugin, A B, JETPLett. 48(7), p. 437–439, 1991.Google Scholar
[5] Cerva, H, Graeff, W, Phys. Stat. Sol. (a) 82, p. 35–45, 1984.Google Scholar
[6] Kotrbová, M, Kadecková, S, Nováik, J, Brádler, J, J. Cryst. Growth 71, p.607–614, 1985.Google Scholar
[7] Authier, A, Lagomarsimo, S, Tanner, B K (editors), X-ray and neutron dynamical diffraction: theory and applications (NATO ASI series, Plenum Press, NY), 1996.Google Scholar
[8] Matsouli, I, Kvardakov, V V, Espeso, I E, Chabert, L, Baruchel, J, submitted to J. Phys.: Appi. Phys. D, 1998.Google Scholar
[9] P, P Engströem, C, C Riekel, J. Synchrotron Rad. 3, p. 97–100, 1996.Google Scholar
[10] Snigirev, A, Rev. Sci. Instrum. 66(2), p. 2053–2058, 1995.Google Scholar
[11] Schulze, C, Lienert, U, Hanfland, M, Lorenzen, M, Zontone, F, J. Synchrotron Rad. 5, p. 77–81, 1998.Google Scholar
[12] Snigirev, A, Kohn, V, Snigireva, I, Lengeler, B, Nature 384, p.49–51, 1996.Google Scholar