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Surface Reactions of Metal Catalysts in Ethanol-CVD Ambient at Low-pressure Studied by in-situ Photoelectron Spectroscopy

Published online by Cambridge University Press:  01 February 2011

Fumihiko Maeda
Affiliation:
[email protected], Nippon Telegraph and Telephone Corporation, NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi-shi, Kanagawa, 225-0015, Japan, +81-46-240-3423, +81-46-240-4711
Satoru Suzuki
Affiliation:
[email protected], NTT Corporation, and CREST, JST, NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi-shi, Kanagawa, 243-0198, Japan
Yoshihiro Kobayashi
Affiliation:
[email protected], NTT Corporation, and CREST, JST, NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi-shi, Kanagawa, 243-0198, Japan
Daisuke Takagi
Affiliation:
[email protected], Tokyo University of Science, and CREST, JST, Department of Physics, 1-3 Kagurazaka, Shinjuku, Tokyo, 162-8601, Japan
Yoshikazu Homma
Affiliation:
[email protected], Tokyo University of Science, and CREST, JST, Department of Physics, 1-3 Kagurazaka, Shinjuku, Tokyo, 162-8601, Japan
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Abstract

We succeeded in growing carbon nanotubes in a photoelectron spectroscopy analysis system using thermal chemical vapor deposition and analyzed the chemical states of the Co catalysts by in-situ x-ray photoelectron spectroscopy before and after the growth. We found that almost all of the Co particles are metallic after the growth in both cases; Co particles are formed from a Co oxide thin film and a metallic Co thin film. This shows that the metallic state is stable for Co under low-pressure ethanol ambient in our growth condition for carbon nanotubes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Helveg, S., López-Cartes, C., Sehested, J., Hansen, P. L., Clausen, B. S., Rostrup-Nielsen, J. R., Abild-Pedersen, F., and Nørskov, J.K., Nature 427, 426 (2004).Google Scholar
2. Ichihashi, T., Fujita, J., Ishida, M., and Ochiai, Y., Phys. Rev. Lett. 92, 215702 (2004).10.1103/PhysRevLett.92.215702Google Scholar
3. Schaper, A. K., Hou, H., Greiner, A., and Phillipp, F., J. Catal. 222, 250 (2004).10.1016/j.jcat.2003.11.011Google Scholar
4. Nishimura, K., Okazaki, N., Pan, L., and Nakayama, Y., Jpn. J. Appl. Phys. 43, L471 (2004).Google Scholar
5. Homma, Y., Takagi, D., and Kobayashi, Y., Appl. Phys. Lett. 88, 023115 (2006).Google Scholar
6. Sharma, R. and Iqbal, Z., Appl. Phys. Lett. 82, 990 (2004).10.1063/1.1646465Google Scholar
7. Maruyama, S., Kojima, R., Miyauchi, Y., Chiashi, S., and Kohno, M., Chem. Phys. Lett. 360, 229 (2002).10.1016/S0009-2614(02)00838-2Google Scholar
8. Maeda, F., Watanabe, Y., Muramatsu, Y., and Oshima, M., Jpn. J. Appl. Phys. 35, 4457 (1996).Google Scholar
9. Rao, A. M., Richter, E., Bandow, S., Chase, B., Eklund, P. C., Williams, K. A., Fang, S., Subbaswamy, K. R., Menon, M., Thess, A., Smalley, R. E., Dresselhause, G., Dresselhaus, M. S., Science 275, 187 (1997).10.1126/science.275.5297.187Google Scholar
10. Kobayashi, Y., Takagi, D., Ueno, Y., and Homma, Y., Physica E 24, 26 (2004).Google Scholar
11. Leiro, J. A., Heinonen, M. H., Laiho, T., and Batirev, I. G., J. Electron Spectrosc. Relat. Phenom. 128, 205 (2003).10.1016/S0368-2048(02)00284-0Google Scholar
12. Yeh, J. J. and Lindau, I., Atomic Data and Nuclear Data Tables 32, 1 (1985).Google Scholar
13. Homma, Y., Kobayashi, Y., Ogino, T., Takagi, D., Ito, R., Jung, Y. J., and Ajayan, M., J. Phys. Chem. B 107, 12161 (2003).Google Scholar
14. de Masi, R., Reinicke, D., Müler, F., Steiner, P., and S. Hüner. Surf. Sci. 515, 523 (2002).10.1016/S0039-6028(02)01970-2Google Scholar
15. Maeda, F., Laffosse, E., Watanabe, Y., Suzuki, S., Homma, Y., Suzuki, M., Kitada, T., Ogiwara, T., Tanaka, A., Kimura, M., Mihai, V. A., Yoshikawa, H., and Fukushima, S., Physica E 24, 19 (2004).Google Scholar
16. Wang, H., Wong, S. P., Cheung, W. Y., Ke, N., Lau, W. F., Chiah, M. F., and Zhang, X. X., Mater. Sci. Eng. C 16, 147 (2001).Google Scholar