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Surface Polymerization of the Thiophen Molecules in Chemically Adsorbed Monolayer

Published online by Cambridge University Press:  01 February 2011

Shin-ichi Yamamoto
Affiliation:
[email protected], kobe Ciy College of Technology, Deparment of elecrical Engineering, 8-3, Gakuen-Higashimachi, Nishi-ku, kobe, 651-2194, Japan, +81-78-795-3236, +81-78-795-3314
Kazufumi Ogawa
Affiliation:
[email protected], Kagawa University, Department of Advanced Materials Science, Faculty of Engineering, 2217-20, Hayashi-cho, Takamatsu, 761-0396, Japan
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Abstract

Using the time-averaged dielectrophoretic force from an applied electric field, we have observed the assembly of a chemically adsorbed monomolecularlayer (CAM) into microwires, connections, and an electric path according to the location within field regions of a lithographically patterned array of two platinum (Pt) electrodes. A Pt electrode/monolayer/Pt electrode junction was fabricated by the self-assembly of a rigid monomolecular, namely 3-{6-{11-(Trichlorosilyl) undecanoyl} hexyl} thiophene (TEN) with thiophen groups, in the lateral direction between the Pt gap electrodes. The technique of a conductive probe AFM (CP-AFM) has been used to investigate the forward bias conduction properties of a TEN film grown by a wet process deposition on a glass substrate. The self-assembly depends on: (1) the ideal rigidity of the chemically adsorptive monomolecular layer (CAM) and (2) the strong affinity of the thiophen end groups of the CAM for the Pt electrode. The current–voltage (I–V) characteristics of the conjugated thiophen junction exhibited stepwise features at room temperature. The (I–V) characteristics can be explained as an electron transport through the junction. From the results in the atmosphere, the conductivity of a lateral conjugated polythiophen group was calculated to be 5.0×104 S/cm. Understanding and using these effects will allow the controlled fabrication and the positioning of microwires or connections at densities far above what is now achievable.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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