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Surface patterns of tetragonal phase FePt thin films from Pt@Fe2O3 core-shell nanoparticles using combined Langmuir-Blodgett and soft lithographic techniques

Published online by Cambridge University Press:  15 February 2011

Qijie Guo
Affiliation:
Department of Chemical Engineering, Laboratory for Laser Energetics (LLE), 206 Gavett , University of Rochester, Rochester, New York 14627-0166, U.S.A.
Xiaowei Teng
Affiliation:
Department of Chemical Engineering, Laboratory for Laser Energetics (LLE), 206 Gavett , University of Rochester, Rochester, New York 14627-0166, U.S.A.
Hong Yang
Affiliation:
Department of Chemical Engineering, Laboratory for Laser Energetics (LLE), 206 Gavett , University of Rochester, Rochester, New York 14627-0166, U.S.A.
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Abstract

We present the fabrication of micron-sized patterns of FePt thin films from Pt@Fe2O3 coreshell nanoparticles. In a typical procedure, Pt@Fe2O3 core-shell nanoparticles were spread and formed a Langmuir film using water as the subphase. This film was lifted onto polydimethylsiloxane (PDMS) stamps with micron-sized patterns of lines, dots and wells, and transferred onto silicon wafers using microcontact printing (ν-CP). The patterns of Pt@Fe2O3 core-shell nanoparticles were converted into face-centered tetragonal phase FePt alloy at enhanced temperatures in the presence of 5% hydrogen. Scanning electron microscopy (SEM), atomic force microscopy (AFM), powder X-ray diffraction (PXRD) and superconducting quantum interference device (SQUID) magnetometer were used to characterize the patterns and the properties of the final FePt alloy films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

1 Weller, D. and Doerner, M. F., Annu. Rev. Mater. Sci., 30, 61 (2000).Google Scholar
2 Ross, C., Ann. Rev. Mater. Res., 31, 203 (2001).Google Scholar
3 Sun, S. H., Anders, S., Hamann, H. F., Thiele, J. U., Baglin, J. E. E., Thomson, T., Fullerton, E. E., Murray, C. B., and Terris, B. D., J. Am. Chem. Soc., 124, 2884 (2002).Google Scholar
4 Guo, Q., Rahman, S., Teng, X., and Yang, H., J. Am. Chem. Soc., 125, 630 (2003).Google Scholar
5 Doyle, P. S., Bibette, J., Bancaud, A., and Viovy, J. L., Science, 295, 2237 (2002).Google Scholar
6 Deng, T., Prentiss, M., and Whitesides, G. M., Appl. Phys. Lett., 80, 461 (2002).Google Scholar
7 Iakovenko, S. A., Trifonov, A. S., Giersig, M., Mamedov, A., Nagesha, D. K., Hanin, V. V., Soldatov, E. C., and Kotov, N. A., Adv. Mater., 11, 388 (1999).Google Scholar
8 Fried, T., Shemer, G., and Markovich, G., Adv. Mater., 13, 1158 (2001).Google Scholar
9 Stine, K. J. and Moore, B. G., in Nano-Surface Chemistry, edited by Rosoff, M., (Marcel Dekker, Inc., New York, 2001).Google Scholar
10 Teng, X. and Yang, H., unpublished results.Google Scholar
11 Teng, X., Black, D., Watkins, N. J., Gao, Y., and Yang, H., Nano Lett., 3, 261 (2003).Google Scholar
12 Hong, M. H. and Hono, K., J. Appl. Phys., 84, 44034409 (1998).Google Scholar
13 Sun, S. H., Murray, C. B., Weller, D., Folks, L., and Moser, A., Science, 287, 1989 (2000).Google Scholar