Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-19T07:28:35.951Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface, Interface and Thin-Film Magnetism: An Overview

Published online by Cambridge University Press:  26 February 2011

L. M. Falicov
L. M. Falicov*
Affiliation:
Department of Physics, University of California, Berkeley CA 94720, and Materials Science Division, Lawrence Berkeley Laboratory, Berkeley CA 94720.
Get access

Abstract

A brief review of the state of the art in the field of surface, interface and thin-film magnetism is presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 231: Symposium S – Magnetic Surfaces, Thin Films and Multilayers , 1991 , 3
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] For a comprehensive review of the field see Falicov, L. M., Pierce, D. T., Bader, S. D., Gronsky, R., Hathaway, K. B., Hopster, H. J., Lambeth, D. N., Parkin, S. S. P., Prinz, G., Salamon, M. B., Schuller, I. K., and Victora, R. H., J. Mater. Res. 5, 1299 (1990).Google Scholar
[2] Moruzzi, V. L., Janak, J. F. and Williams, A. R., Calculated Electronic Properties of Metals (Pergamon, New York, 1978).Google Scholar
[3] Hathaway, K. B., Jansen, H. J. F., and Freeman, A. J., Phys. Rev. B 31, 7603 (1985).Google Scholar
[4] Wang, C. S. and Callaway, J., Phys. Rev. B 15, 298 (1977).CrossRefGoogle Scholar
[5] Jarlborg, T. and Peter, M., J. Magn. Magn. Mat. 42, 89 (1984).CrossRefGoogle Scholar
[6] A discussion of some discrepancies between theory and de Haas - van Alphen data for Co may be found in: Himpsel, F. J. and Eastman, D. E., Phys. Rev. B 21, 3207 (1980).CrossRefGoogle Scholar
[7] See, for example, Victora, R. H. in Magnetic Properties of Low-Dimensional Systems, edited by Falicov, L. M. and Moran-Lpez, J. L. (Springer Verlag, Berlin-Heidelberg-New York-Tokyo, 1986), p. 25.Google Scholar
[8] Kosterlitz, J. M. and Thouless, D. J., in Progress in Low Temperature Physics, edited by Brewer, D. F. (North Holland, Amsterdam,1978), Volume VII B.Google Scholar
[9] Lipowsky, R., Phys. Rev. Lett. 49, 1575 (1982); R. Lipowsky and W. Speth, Phys. Rev. B 28, 2983 (1983); R. Lipowsky, Z. Phys. B. 55, 345 (1984); R. Lipowsky, Phys. Rev. Lett. 52, 1429 (1984); R. Lipowsky, Phys. Rev B 32, 1731 (1985); R. Lipowsky, Ferroelectrics, 73, 69 (1987); R. Lipowsky in Random Fluctuations and Pattern Growth, ed. by H. E. Stanley and N. Ostrowsky (Kluwer Academic, Dordrecht, 1988).Google Scholar
[10],Dietrich, S., in Phase Transitions and Critical Phenomena, edited by Domb, C. and Leibowitz, J. L. (Academic Press, London, 1988), Volume 8, p. 1.Google Scholar
[11] Taylor, G. R., Isin, A. and Coleman, R. V., Phys. Rev. 165, 621 (1968); R. V. Coleman, R. C. Morris, and D. J. Sellmyer, Phys. Rev. B 8, 317 (1973); R. W. Klaffky and R. V. Coleman, Phys. Rev. B 10, 4803 (1974).Google Scholar
[12] Cabrera, G. G. and Falicov, L. M., phys. stat. solidi (b), 61, 539 (1974); R. V. Coleman, R. C. Morris, and D. J. Sellmyer, Phys. Rev. 62, 217 (1974); G. G. Cabrera and L. M. FalTcov, Phys. Rev. B 11, 2651 (1975).Google Scholar
[13] Brown, W. F., Micromagnetics (Wiley, New York, 1963).Google Scholar
[14] Liu, C. and Bader, S. D., Physica B 161, 253 (1989).CrossRefGoogle Scholar
[15] Blègel, S., Weinert, M. and Dedericks, P. H., Phys. Rev. Lett. 60, 1077 (1988).Google Scholar
[16] Allan, G., Surf. Sci. 74, 79 (1978).Google Scholar
[17] Grempel, D. R., Phys. Rev. B 24, 3928 (1981).Google Scholar
[18] Victora, R. H. and Falicov, L. M., Phys. Rev. B 31, 7335 (1985).Google Scholar
[19] Macedo, W. A. A. and Keune, W., Phys. Rev. Lett. 61, 475 (1988).Google Scholar
[20] Moruzzi, V. L., Marcus, P. M., Schwarz, K. and Mohn, P., Phys. Rev. B 34, 1784 (1986); P. M. Marcus, V. L. Moruzzi, Z. Q. Wang, Y. S. Li and-F. Jena, in Physical and Chemical Properties of Thin Metal Overlayers and Alloy Surfaces, edited by D. M. Zener and D. W. Goodman, Materials Research Society Symposia Proceedings, volume 83 (Mat. Res. Soc., Pittsburgh, 1987) p. 21.CrossRefGoogle Scholar
[21] Prinz, G. A., Phys. Rev. Lett. 54, 1051 (1985).Google Scholar
[22] Prinz, G. A., Jonker, B. T., Krebs, J. J., Ferrari, J. M. and Kovanis, F., Appl. Phys. Lett. 48, 1756 (1986).CrossRefGoogle Scholar
[23] Weller, D. and Alvarado, S. F., J. Appl. Phys. 59, 2908 (1986).CrossRefGoogle Scholar
[24] Kwo, J., McWhan, D. B., Hong, M., Gyorgy, E. M., Feldman, L. C. and Cunningham, J. E., in Layered Structures, Epitaxy and Interfaces edited by Gibson, J. M. and Dawson, L. R., Materials Research Society Symposia Proceedings, volume 37 (Mat. Res. Soc., Pittsburgh, 1985) p. 509.Google Scholar
[25] Homma, H., Yang, K., and Schuller, I. K., Phys. Rev. B 36, 9435 (1987).Google Scholar
[26] Berkowitz, A. E. and Grenier, J. H., J. Appl. Phys. 36,73330 (1965); J. Bransky, I. Bransky and A. A. Hirsch, J. Appl. Phys. 41, 183 (1970).Google Scholar
[27] Alexander, K. B., Conner, J. R., List, F. A., McKee, R. A., and Walker, F. J. (private communication).Google Scholar
[28] Berkowitz, A. (private communication).Google Scholar
[29] Freeman, A. J. and Fu, C. L., in Magnetic Properties of Low-Dimensional Systems, edited by Falicov, L. M. and Moran-Lopez, J. L. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1986) p. 16.CrossRefGoogle Scholar
[30] Wang, D. S., Freeman, A. L. and Krakauer, H., Phys. Rev. B 24, 1126 (1981).Google Scholar
[31] Falicov, L. M., Victora, R. H. and Tersoff, J., in The Structure of Surfaces, edited by Hove, M. A. Van and Tong, S. Y. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1985) p. 12, and references therein.Google Scholar
[32] Victora, R. H. and Falicov, L. M., Phys. Rev. B 31, 7335 (1985).CrossRefGoogle Scholar
[33] Klebanoff, L. E., Victora, R. H., Falicov, L. M. and Shirley, D. A., Phys. Rev. B 32, 1997 (1985).Google Scholar
[34] Tersoff, J. and Falicov, L. M., Phys. Rev. B 26, 6186 (1982).Google Scholar
[35] Victora, R. H., Ishida, S. and Falicov, L. M., Phys. Rev. B 30, 3896 (1984).CrossRefGoogle Scholar
[36] Hasegawa, H., J. Phys. F.: Met. Phys. 16, 1555 (1986).Google Scholar
[37] Hermsmeier, B., Osterwalder, J., Friedman, D., and Fadley, C. S., Phys. Rev. Lett. 62, 478 (1989).Google Scholar
[38] Majkrzak, C.F., Cable, J. W., Kwo, J., Hong, M., McWhan, D. B., Yafet, Y., Waszczak, J. V. and Vettier, C., Phys. Rev. Lett. 56, 2700 (1986).CrossRefGoogle Scholar
[39] Salamon, M. B., Sinha, S., Rhyne, J. J., CunnTngham, J. E., Erwin, R. W., Borchers, J. and Flynn, C. P., Phys. Rev. Lett. 56, 259 (1986).CrossRefGoogle Scholar
[40] Yafet, Y., Kwo, J., Hong, M., Majkzak, C. F. and O'Brien, T., J. Appl. Phys. 63, 3453 (1988)Google Scholar
[41] Carbone, C. and Alvarado, S. F., Phys. Rev. B 36, 2433 (1987).Google Scholar
[42] Grunberg, P., Schreiber, R., Pang, Y., Brodsky, M. B. and Sowers, H., Phys. Rev. Lett. 57, 2442 (1986); F. Saurenbach, U. Walz, L. Hinchey, P. Grunberg and W. Zinn, J. Appl. Phys. 63, 3473 (1988).Google Scholar
[43] Heinrich, B., Celinski, Z., Cochran, J. F., Muir, W. B., Rudd, J., Zhong, Q. M., Arrott, A. S., Myrtle, K., and Kirschner, J., Phys. Rev. Lett 64, 673 (1990).Google Scholar
[44] Baibich, M. N., Broto, J. M., Fert, A., Dau, F. Nguyen Van, Petroff, F., Etienne, P., Creuzet, G., Friederich, A. and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).CrossRefGoogle Scholar
[45] Parkin, S. S. P., More, N., and Roche, K. P., Phys. Rev. Lett. 64, 2304 (1990);,S. S.,P. Parkin, A. Mansour, and G. P. Felcher, Appl. Phys. Lett. (to appear); S. S. P. Parkin, R. Bhadra, and K. P. Roche (private communication); S. S. P. Parkin and D. Mauri (private communication).CrossRefGoogle Scholar
[46] Cebollada, A., Martinez, J. L., Gallego, J. M., Miguel, J. J. de, Miranda, R., Ferrer, S., Batallan, F., Fillion, G., and Rebouillat, J. P., Phys. Rev. B. 39, 9726 (1989).CrossRefGoogle Scholar
[47] See the various contributions included in these proceedings.Google Scholar
[48] Hasegawa, H., Phys. Rev. B 42, 2368 (1990); see also these proceedings.Google Scholar
[49] Wang, Y., Levy, P. M., and Fry, J. L., Phys. Rev. Lett. 65, 2732 (1990); P. M. Levy, J. L. Fry, and E. C. Ethridge, these proceedings.Google Scholar
[50] Edwards, D. M., Mathon, J., Muniz, R. B., and Phan, M. S. (private communication)Google Scholar
[51] Mathon, G., these proceedings.Google Scholar
[52] Herman, F., Sticht, J., Schilfgaarde, M. Van, and Methfessel, M., these proceedings.Google Scholar
[53] Jensen, P. J., Bennemann, K. H., Mokrani, A., and Dreysse, H., these proceedings.Google Scholar
[54] Deaven, D. and Rokhsar, D. S., Bull Am. Pys. Soc. 36, 844 (1991).Google Scholar
[55] Jonker, B. T., Walker, K. H., Kisker, E., Prinz, G. A., and Carbone, C., Phys. Rev. Lett. 57, 142 (1986).Google Scholar
[56] Gutierrez, C. J., Mayer, S. H., Qiu, Z. Q., Tang, H., and Walker, J. C., in Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers, edited by Jonker, B. T., Marinero, E. E., and Heremans, J. P., Materials Research Society Symposia Proceedings, volume 13 151 (Mat. Res. Soc., Pittsburgh, 1989), p. 17.Google Scholar
[57] Mathon, J., Rep. Prog. Phys. 51, 1 (1988).Google Scholar
[58] Mathon, J. and Ahmad, S.B., Phys. Rev. B 37, 660 (1988); J. Mathon, Physica 149B, 31 (1988).Google Scholar
[59] Mauri, D., Scholl, D., Siegmann, H.C., and Kay, E., Phys. Rev. Lett. 62, 1900 (1988).Google Scholar
[60] Moodera, J. S. and Meservey, R., Phys. Rev. B 34, 379 (1986).Google Scholar
[61] Slonczewski, J. C., Phys. Rev. B 39, 6995 (1958).Google Scholar
[62] Julliere, M., Phys. Lett. 54A, 225(1975).Google Scholar
[63] Tedrow, P. M. and Meservey, R., Phys. Rev. B 7, 318 (1973).Google Scholar
[64] Gaefvert, U. and Maekawa, S., IEEE Trans. Mag. MAG- 18, 707 (1982).Google Scholar
[65] Erwin, R. W., Rhyne, J. J., Salamon, M. B., Borchers, J., Sinha, S., Du, R., Cunningham, J. E. and Flynn, C. P., Phys. Rev. B 35, 6808 (1987).Google Scholar
[66] Yang, K. Y., Homma, H., and Schuller, I. K., J. Appl. Phys. 63, 4066 (1988).Google Scholar
[67] Borchers, J. A., Nieuwenhuys, G., Salamon, M. B., Flynn, C. P., Du, R., Erwin, R. W. and Rhyne, J. J., J. de Physique 49–C8, 1685 (1988).Google Scholar
[68] See for instance, Schuller, I. K. and Homma, H., Mat. Res. Soc. Bulletin XII, 1 (1987).Google Scholar
[69] See various articles in Physics, Fabrication and Applications of Multilayered Structures, edited by Dhez, P. and Weisbuch, C. (Plenum Press, New York, 1988).Google Scholar
[70] Colvard, C., Merlin, R., Klein, M. V. and Gossard, A. C., Phys. Rev. Lett. 45, 298 (1980).Google Scholar