Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-24T03:19:51.863Z Has data issue: false hasContentIssue false

The Surface Electronic Band Structure CoS2(001)

Published online by Cambridge University Press:  01 February 2011

Ning Wu
Affiliation:
[email protected], University of Nebraska- Lincoln, Dept. of Physics and Astronomy and the Nebraska Center for Materials and Nanoscience, Lincoln, Nebraska, United States
Ya. B. Losovyj
Affiliation:
[email protected], Louisiana State University, Center for Advanced Microstructures and Devices, Baton Rouge, Louisiana, United States
Michael Manno
Affiliation:
[email protected], University of Minnesota, Department of Chemical Engineering and Materials Science, Minneapolis, Minnesota, United States
Chris Leighton
Affiliation:
[email protected], University of Minnesota, Department of Chemical Engineering and Materials Science, Minneapolis, Minnesota, United States
Peter Dowben
Affiliation:
[email protected], University of Nebraska- Lincoln, Dept. of Physics and Astronomy and the Nebraska Center for Materials and Nanoscience, Lincoln, Nebraska, United States
Get access

Abstract

Angle-resolved photoemission was used to study the surface electronic band structure of ferromagnetic CoS2(below 120K) in high-quality single crystal samples. Strongly dispersing Co t2g bands are identified along the <100> k// direction. Fermi level crossings are identified along this Γ - X line (of the surface Brillouin zone) in higher resolution photoemission spectra, suggesting that the overall polarization may be controlled by the details of the band structure, particularly the surface band structure, rather than by exchange splitting on the Co atoms.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Zhao, G.L., Callaway, J., and Hayashibara, M., Phys. Rev. B 48, 15781 (1993)Google Scholar
[2] Kwon, S.K., Youn, S. J., and Min, B. I., Phys. Rev. B 62, 357 (2000)Google Scholar
[3] Shishidou, T., Freeman, A. J., and Asahi, R., Phys. Rev. B 64, 180401 (2001)Google Scholar
[4] Mazin, I.I., Appl. Phys. Lett. 77, 3000 (2000)Google Scholar
[5] Umemoto, K., Wentzcovitch, R.M., Wang, L., Leighton, C., Physica Status Solidi B 243, 21172121 (2006)Google Scholar
[6] Ramesha, K., Seshadri, R., Ederer, C., He, T., Subramanian, M.A., Phys. Rev B 70, 214409 (2004)Google Scholar
[7] Wu, N., Losovyj, Y. B., Wisbey, D., Belashchenko, K., Manno, M., Wang, L., Leighton, C., and Dowben, P. A., J. Phys. Cond. Matter 19 156224 (2007)Google Scholar
[8] Ohsawa, A., Yamaguchi, Y., Watanabe, H. and Itoh, H., J. Phys. Soc. Jpm. 40, 986 (1976)Google Scholar
[9] Adachi, K., Sato, K., and Takeda, M., J. Phys. Soc. Jpm. 26, 631 (1969)Google Scholar
[10] Wang, L., Chen, T.Y., and Leighton, C., Phys. Rev. B 69, 094412 (2004).Google Scholar
[11] Nadgorny, B., Mazin, I. I., Osofsky, M., Soulen, R.J., Broussard, P., Stroud, R.M., Singh, D.J., Harris, V.G., Arsenov, A., and Mukovskii, Ya., Phys. Rev. B 63, 184433 (2001)Google Scholar
[12] Nadgorny, B., J. Phys. Cond. Matter 19, 315209 (2007)Google Scholar
[13] Wang, L., Umemoto, K., Wentzcovitch, R.M., Chen, T.Y., Chien, C.L., Checkelsky, J.G., Eckert, J.C., Dahlberg, E.D., and Leighton, C., Phys. Rev. Lett. 94, 056602 (2005)Google Scholar
[14] Guevara, J., Vildosola, V., Milano, J., Llois, A.M., Phys. Rev B 69, 184422 (2004)Google Scholar
[15] Dowben, P.A. and Skomski, R., J. Applied Physics 95 (2004) 74537458 Google Scholar
[16] Dowben, P.A. and Jenkins, S.J.. in Frontiers in Magnetic Materials, edited by Anant Narlikar, Springer Verlag (2005) 295325 Google Scholar
[17] Velev, J. P., Dowben, P. A., Tsymbal, E. Y., Jenkins, S. J. and Caruso, A. N., Surface Science Reports 63, 400 (2008)Google Scholar
[18] Wang, L., Chen, T.Y., Chien, C.L. and Leighton, C., Appl. Phys. Lett. 88, 232509 (2006).Google Scholar
[19] Yu, Z. X., Van Hove, M. A., Tong, S. Y., Wisbey, D., Losovyj, Y. B., Wu, N., Manno, M., Wang, L., Leighton, C., Mei, W. N., and Dowben, P. A., J. Phys. Cond. Matter 19 156223 (2007)Google Scholar
[20] Jin, Y. J. and Lee, J. I., Phys. Rev. B 73, 064405 (2006)Google Scholar
[21] Wu, N., Sabirianov, R.F., Duan, Chun-gang, Mei, W. N., Wisbey, D., Losovyj, Ya. B., Manno, M., Leighton, C., Cai, En, Zhang, Jiangdi and Dowben, P. A., J. Phys. Cond, Matter 20 215131 (2008)Google Scholar
[22] Losovyj, Ya., Ketsman, I., Morikawa, E., Wang, Z., Tang, J., Dowben, P., Nucl. Instrumen. Methods Phys. Res. A 582, 264 (2007) 264266 Google Scholar
[23] Losovyj, Ya., Morris, K., Rosa, L., Scott, J.D., Dowben, P., Nucl. Instrumen. Methods Phys. Res. A 582, 258 (2007)Google Scholar
[24] Takahashi, T., Naitoh, Y., Sato, T., Kamiyama, T., Yamada, K., Hiraka, H., Endoh, Y., Usuda, M., and Hamada, N., Phys. Rev. B 63, 094415 (2001)Google Scholar
[25] Fonin, M., Pentcheva, R., Dedkov, Yu. S., Sperlich, M., Vyalikn, D. V., Scheffler, M., Rudiger, U., and Guntherodt, G., Phys. Rev. B 72, 104436 (2005)Google Scholar