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Suppression of the Tetragonal Distortion in Thin Pb(Zr,Ti)O3 Films Grown on MgO(001)

Published online by Cambridge University Press:  10 February 2011

H. C. Kang ,
D. Y. Noh ,
J. H. Je  and
H. K. Kim
H. C. Kang
Affiliation:
Department of Materials Science and Engineering, and Center for Electronic Materials Research, Kwangju Institute of Science and Technology (K-JIST), Kwangju 506-712, [email protected]
D. Y. Noh
Affiliation:
Department of Materials Science and Engineering, and Center for Electronic Materials Research, Kwangju Institute of Science and Technology (K-JIST), Kwangju 506-712, [email protected]
J. H. Je
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea
H. K. Kim
Affiliation:
Department of Physics, Pusan National University, Pusan 609-735, Korea
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Abstract

The paraelectric cubic to ferroelectric tetragonal phase transformation of thin Pb(Zr,Ti)O3/MgO(001) films was studied in synchrotron x-ray scattering experiments. As the thickness of the film decreases, the transition temperature and the amount of the tetragonal distortion were decreased continuously. The thinnest 250 Å thick film was purely composed of the c-type domains in the ferroelectric tetragonal phase. Based on this, we propose a model for the domain structure of the tetragonal PZT/MgO(001) film that is different from the ones suggested in literature. We attribute the suppression of the transition to the substrate effect that prefers the c-type domains near the interface, and reduces the tetragonal distortion to minimize the film-substrate lattice mismatch.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 493: Symposium U – Ferroelectric Thin Film VI , 1997 , 317
Copyright
Copyright © Materials Research Society 1998

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References

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