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Published online by Cambridge University Press: 12 January 2012
Using AFM, ellipsometric and profilometric measurements, we have investigated the topography and the thickness of the cellulose nanocristal (NCC) films prepared by two different methods: the first one is obtained by evaporation of concentrated suspension of NCC in petri-dish to produce a self-supported film; the second one is produced by dipping thin NCC layer on silicon substrate by Langmuir-Blodgett (LB) technique. Glucomanan (GM) functionalized AFM tip was brought into contact with these two kinds of NCC films in order to measure the adhesion between GM and NCC. The impact of the substrate and the thickness of NCC films on the measured adhesion forces were also studied: the mean measured adhesion force between the two polysaccharides was 17 nN regardless of the way the films were prepared. Adhesion properties can help us understand biochemical processes in the plant cell wall.