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Sub-Feature Speckle Interferometry: A New Approach To Temperature Measurement

Published online by Cambridge University Press:  15 February 2011

D. Burckel ,
S. H. Zaidi  and
S. R. J. Brueck
D. Burckel
Affiliation:
Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87131
S. H. Zaidi
Affiliation:
Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87131
S. R. J. Brueck
Affiliation:
Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87131
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Abstract

A new speckle technique, sub-feature speckle interferometry, is introduced that relies on the amplitude interference of two independent speckle patterns, originating from coherent illumination, using an optical system that produces interferometric quality interference fringes on a scale comparable to the speckle correlation length. Examples are given for in-plane translation, sample tilt, and temperature measurement (strain). A temperature measurement accuracy σ = 0.92°C is realized. In contrast to traditional full-field speckle cross-correlation techniques, this technique requires only a small number of detector elements with minimal signal processing and is compatible with many real-time sensor applications. Measurements of the optical phase across a speckle feature are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 387: Symposium P – Rapid Thermal and Integrated Processing IV , 1995 , 125
Copyright
Copyright © Materials Research Society 1995

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References

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