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Published online by Cambridge University Press: 26 February 2011
Experimental observation of the photovoltaic effect of a semiconductor grain boundary with a scanning laser beam is analyzed assuming a single trap energy level. The photo-current is calculated from the recombination velocity and the concentration of minority carriers at a grain boundary which was derived from the continuity equation. Open circuit voltage across a sample is obtained from equating this recombination current to compensating thermionic emission current. Using recombination velocity and diffusion length as variables, tha calculated open circuit voltage is compared with experimental data.