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The Study of the Dislocation Structure and Energy of NiO-Pt Interfaces

Published online by Cambridge University Press:  21 February 2011

F.-S. Shieu  and
S. L. Sass
F.-S. Shieu
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853-1501
S. L. Sass
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853-1501
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Abstract

The dislocation structure of Pt-(001)NiO interfaces was studied using electron microscopy and electron diffraction techniques. Specimens were produced by hot pressing polycrystalline Pt films on to thin NiO single crystals, and bulk Pt single crystals on to bulk NiO single crystals. The polycrystalline Pt specimens were used to determine the favored orientation relationships between the NiO and Pt, while the bulk NiO-Pt specimens were used to study the detailed structure of the interface. Three categories of orientation relationships were identified: exact epitaxy with (001)Pt ║ (001)NiO, [110]Pt ║ [110]NiO; small rotations away from exact epitaxy about the common [001] direction; high index planes of Pt parallel to (001) of NiO. Theoretical calculations of the expected dislocation structures of interfaces with the first two orientation relationships were made using a Bollmann-type analysis. The experimental observations and theoretical predictions were shown to be in good agreement. The energies of the interfaces having the first two orientation relationships were shown to be similar which is believed to be the reason why they both occur.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 170: Symposium N – Interfaces in Composites , 1989 , 91
Copyright
Copyright © Materials Research Society 1990

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