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Study of Surface Defects With the Reflected Electrons

Published online by Cambridge University Press:  26 February 2011

Tung Hsu
Tung Hsu*
Affiliation:
Department of Materials Science and Engineering, University of Utah, Salt Lake City, UT 84112, U.S.A.
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Abstract:

Studying crystal surfaces using the forward scattered high energy electrons Is discussed.Performance and applications of the basic REM and several variations of this technique are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 629
Copyright
Copyright © Materials Research Society 1991

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References

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