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The Study of Materials Using Wavelet Image Processing Techniques

Published online by Cambridge University Press:  22 February 2011

L. Beltrán-Del-Rŕo ,
A. Gónez  and
M. José-Yacamán
L. Beltrán-Del-Rŕo
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, México D. F. 01000, P.O. Box 20–354.
A. Gónez
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, México D. F. 01000, P.O. Box 20–354.
M. José-Yacamán
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, México D. F. 01000, P.O. Box 20–354.
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Abstract

In this work the wavelet transform is used to process high- and medium resolution electron micrographs from small particles and their substrates. It is concluded that the edge sensitivity of the technique and its contrast enhancement capabilities are most useful in the processing of electron micrographs.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 217: Symposium U – Advanced Tomographic Imaging Methods for the Analysis of Materials , 1990 , 183
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Grossmann, A., Morlet, J. and Paul, T., J. Math. Phys. 28, 2473 (1985)Google Scholar
2. Ingrid, Daubechies, IEEE Transactions on information theory 36, 961 (1990)Google Scholar