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Study of Grain Boundaries in YBCO Thin Films Using Microraman Spectroscopy

Published online by Cambridge University Press:  15 February 2011

O. Martinez ,
J. Jimenez ,
P. Martin ,
D. Chambonnet ,
S. Degoy  and
C. Belouet
O. Martinez
Affiliation:
Fisica de la Materia Condensada, ETS Ingenieros Industriales, 47011 Valladolid, Spain
J. Jimenez
Affiliation:
Fisica de la Materia Condensada, ETS Ingenieros Industriales, 47011 Valladolid, Spain
P. Martin
Affiliation:
Fisica de la Materia Condensada, ETS Ingenieros Industriales, 47011 Valladolid, Spain
D. Chambonnet
Affiliation:
Alcatel Alsthom, Route de Nozay, 91460 Maccoussis, France
S. Degoy
Affiliation:
Alcatel Alsthom, Route de Nozay, 91460 Maccoussis, France
C. Belouet
Affiliation:
Alcatel Alsthom, Route de Nozay, 91460 Maccoussis, France
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Abstract

MicroRaman spectroscopy allows to identify the presence of c| and c⊥ oriented grains in YBCO thin films. This is achieved by the observation of two Raman modes associated with the oxygen sublattice vibrations, ˜500 cm−1 and ˜338 cm−1. The relative intensity of these Raman modes is related to the presence of c⊥ and c⊥;. oriented grains. Using the high lateral resolution of the Raman microprobe (<1 μm) some needle shaped grains of the films were scanned. The different Raman parameters were analyzed, showing noteworthy transformations at the [c|;]/[c⊥] boundaries. In particular the Raman mode corresponding to the out of phase O (2)– O(3) in plane vibrations (˜338 cm−1) was found to be narrowed, which should account for a decoupling of the phonon with the electronic continuum.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 401: Symposium G – Epitaxial Oxide Thin Films II , 1995 , 405
Copyright
Copyright © Materials Research Society 1996

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