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Study of Elastic Behavior of Metallic Thin Films by 2D Synchrotron XRD and in situ Tensile Testing

Published online by Cambridge University Press:  01 February 2011

Geandier Guillaume ,
Renault Pierre-Olivier ,
Goudeau Philippe ,
Eric Le Bourhis  and
Girault Baptiste
Geandier Guillaume
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962France
Renault Pierre-Olivier
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
Goudeau Philippe
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
Eric Le Bourhis
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2M I-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
Girault Baptiste
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
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Abstract

Understanding the mechanical behaviour of nano-structured thin films in relation to their structure, in particular to the grain size, is of high importance for the development of technological applications. Model nanometric multilayer W/Au systems exhibiting different structures are elaborated. These films are supported by a (thin) polyimide substrate. Films mechanical response is characterized experimentally by tensile tests carried out in-situ in a X-ray diffractometer installed on a synchrotron source. X-ray diffraction in transmission geometry has been used to study the deformations of both phases as a function of applied load. This geometry has been developed in the aim of optimizing the experiment time.

Keywords

x-ray diffraction (XRD)thin filmelastic properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1027: Symposium D – Materials in Transition–Insights from Synchrotron and Neutron Sources , 2007 , 1027-D01-09
Copyright
Copyright © Materials Research Society 2008

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