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Study of Elastic Behavior of Metallic Thin Films by 2D Synchrotron XRD and in situ Tensile Testing

Published online by Cambridge University Press:  01 February 2011

Geandier Guillaume ,
Renault Pierre-Olivier ,
Goudeau Philippe ,
Eric Le Bourhis  and
Girault Baptiste
Geandier Guillaume
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962France
Renault Pierre-Olivier
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
Goudeau Philippe
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
Eric Le Bourhis
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2M I-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
Girault Baptiste
Affiliation:
[email protected], University of Poitiers, Laboratoire de Métallurgie Physique, UMR 6630 CNRS, SP2MI-Téléport 2-Bd Marie et Pierre Curie, BP 30179, Futuroscope-chasseneuil Cedex, F-86962, France
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Abstract

Understanding the mechanical behaviour of nano-structured thin films in relation to their structure, in particular to the grain size, is of high importance for the development of technological applications. Model nanometric multilayer W/Au systems exhibiting different structures are elaborated. These films are supported by a (thin) polyimide substrate. Films mechanical response is characterized experimentally by tensile tests carried out in-situ in a X-ray diffractometer installed on a synchrotron source. X-ray diffraction in transmission geometry has been used to study the deformations of both phases as a function of applied load. This geometry has been developed in the aim of optimizing the experiment time.

Keywords

x-ray diffraction (XRD)thin filmelastic properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1027: Symposium D – Materials in Transition–Insights from Synchrotron and Neutron Sources , 2007 , 1027-D01-09
Copyright
Copyright © Materials Research Society 2008

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References

1. Shenoy, V. B., Phys. Rev. B 71, 2005 094104.Google Scholar
2. Workum, K. Van, Pablo, J. J. de, Phys. Rev. E 67, 2003 031601.10.1103/PhysRevE.67.031601Google Scholar
3. Badawi, K. F., Villain, P., Goudeau, Ph., Renault, P.-O., Appl. Phys. Lett. 80, 2002 4705.10.1063/1.1488701Google Scholar
4. Yu, D. Y. W., Spaepen, F., J. Appl. Phys. 95, 2004 2991.10.1063/1.1644634Google Scholar
5. Kalkmann, A. J., Verbruggen, A. H., and Janssen, G. C. A. M., Appl. Phys. Lett. 78, 2001 2673.10.1063/1.1367896Google Scholar
6. Schiøtz, J., Vegge, T., Tolle, F. D. Di, and Jacobsen, K. W., Phys. Rev. B 60, 1999 11971.10.1103/PhysRevB.60.11971Google Scholar
7. Jaouen, M., Pacaud, J., Jaouen, C., Phys. Rev. B 64, 2001, 144106.10.1103/PhysRevB.64.144106Google Scholar
8. Zhou, L.G., Huang, H., Appl. Phys. Lett. 86 2004, 1 Google Scholar
9. Noyan, I.C., Sheikh, G., Mat. Res. Soc. Symp. Proc. 308 1993, 3 Google Scholar
10. Faurie, D., Castelnau, O., Brenner, R., Renault, P.O., Bourhis, E. Le, Goudeau, Ph., Patriarche, G., Appl. Phys. Lett. 89 2006 061911 10.1063/1.2335779Google Scholar
11. Faurie, D., Renault, P.-O., Bourhis, E. Le, Villain, P., Goudeau, Ph., Badawi, K. F., Thin Solid Films, 469–470 2004 201.10.1016/j.tsf.2004.08.097Google Scholar
12. , Yu, Lai, Y.H. Lu, M.O. Zheng, L. Y., G., Surface and Coatings Techn. 200 2006 4006 10.1016/j.surfcoat.2005.01.094Google Scholar
13. Pina, J., Dias, A. Lebrun, J.L., Mat. Sci. Engin. A 267 1999 130 10.1016/S0921-5093(99)00050-7Google Scholar
14. Martinschitz, K.J., Eiper, E., Massl, S., Köstenbauer, H., Daniel, R., Fontalvo, G., Mitterer, C., Keckes, J., J. Appl. Cryst. 39 (2006) 777 10.1107/S002188980603322XGoogle Scholar
15. Böhm, J., Gruber, P., Spolenak, R., Stierle, A., Wanner, A., Arzt, E., Review of Scientific Instruments 75, (2004) 1110.10.1063/1.1669124Google Scholar
16. Villain, P., Goudeau, Ph., Renault, P.-O., Badawi, K. F., Appl. Phys. Lett. 81, (2002) 4365.10.1063/1.1527229Google Scholar
17. Hammersley, A., fit2d software, http://www.esrf.eu/computing/scientific/FIT2D/Google Scholar
18. Faurie, D., Renault, P.-O., Le Bourhis, E., Goudeau, P, Materials Research Society Symposium Proceedings 875, art. no. O4.7, 2005, 103–108 Google Scholar