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Studies of the Dielectric Constant of Thin Film Bismuth Nanowire Samples Using Optical Reectometry

Published online by Cambridge University Press:  17 March 2011

M. R. Blacka ,
Y.-M. Lin ,
S. B. Cronin ,
O. Rabin ,
M. P adi  and
M. S. Dresselhaus
M. R. Blacka
Affiliation:
Department of EEC, assachusetts nstitute of ec hnology, Cambridge, MA Electronic mail: [email protected]
Y.-M. Lin
Affiliation:
Department of EEC, assachusetts nstitute of ec hnology, Cambridge, MA
S. B. Cronin
Affiliation:
Department of hysics, assach usetts nstitute of echnology, Cambridge, MA
O. Rabin
Affiliation:
Department of Chemistry, assach usetts nstitute of echnology, Cambridge, MA
M. P adi
Affiliation:
Department of hysics, assach usetts nstitute of echnology, Cambridge, MA
M. S. Dresselhaus
Affiliation:
Department of EEC, assachusetts nstitute of ec hnology, Cambridge, MA Department of hysics, assach usetts nstitute of echnology, Cambridge, MA Currently on leave from MIT
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Abstract

Arrays of 10 to 120 nm diameter single crystalline bismuth nanowires havebeen formed inside amorphous alumina templates. ince bismuth has a small e ective mass compared to other materials, signi cant quantum mechanical con nement is expected to occur in wires with diameter less than 50nm. he subbands formed b yquantum con nement cause in teresting modi cations to the dielectric function of bismuth. his study measures the dielectric function of bismuth nanowires in an energy range where the e ects of quantum con nement are predicted (0.05 to 0.5e). Using F ourier transforminfrared re ectometry, the dielectric constant as a function of energy is obtained for the alumina/bismuth composite system. E ective medium theory is used to subtract the e ect of the alumina template from the measurement of the composite material, thus yielding the dielectric function of bismuth nanowires. A strong absorption peak is observed at ∼1000cm−1 in the frequency dependent dielectric function in the photon energy range measured. he dependence of the frequency and intensity of this oscillator on incident light polarization and wire diameter are reviewed. n addition, the dependence of the optical absorption on antimony and tellurium doping of the nanowires are reported.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 635: Symposium C – Anisotropic Nanoparticles-Synthesis, Characterization & Applications , 2001 , C4.32
Copyright
Copyright © Materials Research Society 2001

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References

[1] Kouklin, N., Bandyopadhyay, S., Tereshin, S., Varfolomeev, A., and Zaretsky, D., Applied Physics Letters 76, 460–519 (2000).Google Scholar
[2] Aspnes, D. E., Heller, A., and Porter, J. D., J. Appl. Phys. 60, 3028–3034 (1986).Google Scholar
[3] Dresselhaus, M. S., Koga, T., Sun, X., Cronin, S. B., Wang, K. L., and Chen, G.. In Sixteenth International Conference on Thermoelectrics: Proceedings, ICT'97; Dresden, Germany, edited by Heinrich, Armin and Schumann, Joachim, pages 12–20, Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ 09955-1331, 1997. IEEE Catalog Number 97TH8291; ISSN 1094-2734.Google Scholar
[4] Hicks, L. D. and Dresselhaus, M. S., Phys. Rev. B 47, 12727–12731 (1993). C4.32.6Google Scholar
[5] Das, V. Damodara and Soundararajan, N., Phys. Rev. B. 35, 5990–5996 (1987).Google Scholar
[6] Lin, Y. M., Sun, X., and Dresselhaus, M. S., Phys. Rev. B 62, 4610–4623 (2000).Google Scholar
[8] Black, M. R., Padi, M., Cronin, S., Lin, Y.-M., Rabin, O., McClure, T., Dresselhaus, G., Hagelstein, P. L., and Dresselhaus, M. S., Appl. Phys. Lett. 75 (2000).Google Scholar
[9] Zhang, Z., Ying, J., and Dressehaus, M., J. Mater. Res. 13, 1745–1748 (1998).Google Scholar
[10] Heremans, J., Thrush, C. M., Lin, Y., Cronin, S., Zhang, Z., Dresselhaus, M. S., and Mansfield, J. F., Physical Review B 61, 2921–2930 (2000).Google Scholar
[11] Hornyak, G. L., Patrissi, C. J., and Martin, C. R., J. Phys. Chem. B. 101, 1548–1555 (1997).Google Scholar
[12] Foss, C. A. Jr., Hornyak, G. L., Stockert, J. A., and Martin, C. R., J. Phys. Chem. B. 98, 2963–2971 (1994).Google Scholar
[13] Aspnes, D. E., Thin Solid Films 89, 249–262 (1982).Google Scholar
[14] Cherkas, N. L., Opt. Spectrosc. 81, 906–912 (1996).Google Scholar
[15] Lenoir, B., Dauscher, A., Devaux, X., Martin-Lopez, R., Ravich, Yu.I., Scherrer, H., and Scherrer, S.. In Fifteenth International Conference on Thermoelectrics: Proceedings, ICT '96, pages 1–13, Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ 09955-1331, 1996.Google Scholar
[16] Goldsmid, H. J., Phys. Stat. Sol. 1, 7–28 (1970).Google Scholar