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Studies of Calcium-Nickel-Potassium Oxide Films by Synchrotron X-Ray Fluorescence Microscopy

Published online by Cambridge University Press:  15 February 2011

D. L. Perry ,
A. C. Thompson ,
R. E. Russo  and
X. L. Mao
D. L. Perry
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, CA 94720
A. C. Thompson
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, CA 94720
R. E. Russo
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, CA 94720
X. L. Mao
Affiliation:
Lawrence Berkeley Laboratory University of California Berkeley, CA 94720
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Abstract

The use of synchrotron x-ray fluorescence microscopy to study the composition and homogeneity of laser deposited films of calcium-nickel-potassium oxides is described. Experimental conditions for preparing the films are given, and the results are discussed with respect to the x-ray fluorescence data concerning the distribution of the three metals in the films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 375: Symposia AA – Applications of Synchrotron Radiation Techniques to Materials Science , 1994 , 307
Copyright
Copyright © Materials Research Society 1995

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References

1. Perry, D. L., Berdahl, P., and Perrino, C., J. Mater. Res., 9, 2993(1994).Google Scholar
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5. Thompson, A. C., Chapman, K. L., and Underwood, J. H., Optics for High-Brightness Synchrotron Beamlines, SPIE, 1740(1992).Google Scholar