Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T17:48:48.172Z Has data issue: false hasContentIssue false

Structures of Silver/Chromium Metallic Superlattice

Published online by Cambridge University Press:  21 February 2011

Takeo Kaneko
Affiliation:
Department of Materials Science, Faculty of Engineering, University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113, Japan
Kentabo Kyuno
Affiliation:
Research Center for Advanced Science and Technology, University of Tokyo, Komaba 4-6-1, Meguro-ku, Tokyo 153, Japan
Osamu Niikura
Affiliation:
Department of Materials Science, Faculty of Engineering, University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113, Japan
Shigeki Hara
Affiliation:
Department of Materials Science, Faculty of Engineering, University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113, Japan
Ryoichi Yamamoto
Affiliation:
Research Center for Advanced Science and Technology, University of Tokyo, Komaba 4-6-1, Meguro-ku, Tokyo 153, Japan
Get access

Abstract

Ag/Cr metallic superlattices with bilayer thickness in the range of 17–136Å were prepared by metal-MBE method. X-ray diffraction measurements indicated that the thickness fluctuations of each layer were rather small. The lattice matching at the interface between Ag(100) and Cr(100) is almost perfect. But, the interplanar spacings of Ag(100) and Cr(100) changed as a function of bilayer thickness. Surface wave velocities have been measured using Brillouin spectroscopy. In contrast to Au/Cr superlattices which show a hardening, a plot of surface wave velocities as a function of the bilayer thickness in Ag/Cr superlattices showed a distinct dip.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kueny, A., Grimsditch, M., Miyano, K., Banerjee, I., Falco, C.M. and Schuller, I. K., Phys.Rev.Lett. 48, 166 (1982).Google Scholar
2. Khan, M.R., Chun, C.S.L., Felcher, G.P., Grimsditch, M., Kueny, A., Falco, C.M. and Schuller, I.K., Phys.Rev.B 27, 7186 (1983).Google Scholar
3. Danner, R., Huebener, R.P., Chun, C.S.L., Grimsditch, M. and Schuller, I.K., Phys. Rev.B 33, 3696 (1986).Google Scholar
4. Bell, J.A., Bennett, W.R., Zanoni, R., Stegeman, G.I., Falco, C.M. and Nizzoli, F., Phys.Rev.B 35, 4127 (1987).Google Scholar
5. Kueny, A. and Grimsditch, M., Phys.Rev.B 26, 4699 (1982).Google Scholar
6. Wu, T.B., J.Appl.Phys. 53, 5413(1987).Google Scholar
7. Clemens, B.M. and Eesley, G.L., Phys.Rev.Lett. 61, 2356 (1988).Google Scholar
8. Bisanti, P., Brodsky, M.B., Felcher, G.P., Grimsditch, M. and Sill, L.R., Phys.Rev. B 35, 7813 (1987).Google Scholar
9. Locquet, J.-P., Neerinck, D., Stockman, L. and Bruynseraede, Y., Phys.Rev.B 39, 13338 (1989).Google Scholar