Hostname: page-component-f554764f5-44mx8 Total loading time: 0 Render date: 2025-04-09T12:55:14.294Z Has data issue: false hasContentIssue false
  • English
  • Français

Structure of The Annealed Au-Si(100) System: A Uhv-Hrem Study

Published online by Cambridge University Press:  21 February 2011

G. Jay Aram  and
L. D. Marks
G. Jay Aram
Affiliation:
Department of Materials Science and Engineering, Northwestern University Evanston, IL 60208
L. D. Marks
Affiliation:
Department of Materials Science and Engineering, Northwestern University Evanston, IL 60208
Get access

Abstract

The structure obtained on annealing sub-monolayer of Au deposited on clean Si(100) surfaces at room temperature was studied using mainly ultrahigh vacuum transmission electron imaging (UHV-HREM). Spots suggesting a 5×1 type reconstruction and faint 1/2 order streaks were seen in the diffraction patterns. The reconstructed wave shows pairs of Au-rows which correspond to the “trenches” reported in an earlier STM study. Lateral disorder across the rows was seen to be responsible for the streaks in the patterns.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 355: Symposium B1 – Evolution of Thin-Film and Surface Structure and Morphology , 1994 , 275
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Narusawa, T., Kinoshita, K., Gibson, W. M. and Hiraki, A., J. Vac. Sci. Technol. 18, 872 (1981).Google Scholar
2. Hricovini, K., Bonnet, J. E., Carrière, B., Deville, J. P., Hanbücken, M. and LeLay, G., Surf. Sci. 211/212, 630 (1989).Google Scholar
3. Hanbücken, M., Imam, Z., Métois, J. J. and LeLay, G., Surf. Sci. 162, 628 (1985).Google Scholar
4. Oura, K., Makino, Y. and Hanawa, T., Jap. J. App. Phys. 15, 737 (1976).Google Scholar
5. Oura, K. and Hanawa, T., Surf. Sci. 82, 202 (1979).Google Scholar
6. Lu, Z. H., Sham, T. K. and Norton, P. R., Solid State Comm. 85, 957 (1993).Google Scholar
7. Lin, X. F., Wan, K. J., Glueckstein, J. C. and Nogami, J., Phys. Rev. B 47, 3671 (1993).Google Scholar
8. Bonevich, J. E. and Marks, L. D., Microscopy 22, 95 (1992).Google Scholar
9. Marks, L. D., Separate article in the current proceedings.Google Scholar