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Structural Investigation of SiC/Al4C3 and SiC/TiC Interfaces Formed in the Brazing of Sic

Published online by Cambridge University Press:  25 February 2011

T. Yano ,
S. Kato ,
H. Suematsu  and
T. Iseki
T. Yano
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152, Japan
S. Kato
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152, Japan
H. Suematsu
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152, Japan
T. Iseki
Affiliation:
Departmentof Inorganic Materials, Faculty of Engineering, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152, Japan
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Abstract

Two heterophase interfaces formed in the joining of α-SiC were investigated using high-resolution electron microscopy coupled with a multi-slice structural image simulation. A reaction product TiC was formed epitaxially on the basal plane of α-SiC single crystal when SiC was brazed with a Ag-Cu alloy containing small amount of Ti. A coherent interface with Si-C and Ti-C bonding was found between the SIC(0001) and TiC(111). Al4C3 was grown also epitaxially on the basal plane of SiC when it was brazed with AL. A semicoherent interface including interfacial dislocations and intermediate' transition phase was observed between the SIC(0001) and Al4C3(0001). It was estimated that the carbon atom sublattice was maintained through those crystals.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 221: Symposium C – Heteroepitaxy of Dissimilar Materials , 1991 , 105
Copyright
Copyright © Materials Research Society 1991

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References

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