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Structural dynamics of PZT thin films at the nanoscale

Published online by Cambridge University Press:  26 February 2011

Alexei Grigoriev ,
Dal-Hyun Do ,
Dong Min Kim ,
Chang-Beom Eom ,
Bernhard Adams ,
Eric M. Dufresne  and
Paul G. Evans
Alexei Grigoriev
Affiliation:
[email protected], University of Wisconsin - Madison, 1509 University Avenue, Madison, WI, 53706, United States, 608-262-7433
Dal-Hyun Do
Affiliation:
[email protected], University of Wisconsin - Madison, United States
Dong Min Kim
Affiliation:
[email protected], University of Wisconsin - Madison, United States
Chang-Beom Eom
Affiliation:
[email protected], University of Wisconsin - Madison, United States
Bernhard Adams
Affiliation:
[email protected], Argonne National Laboratory, United States
Eric M. Dufresne
Affiliation:
[email protected], Argonne National Laboratory, United States
Paul G. Evans
Affiliation:
[email protected], University of Wisconsin - Madison, United States
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Abstract

When an electric field is applied to a ferroelectric the crystal lattice spacing changes as a result of the converse piezoelectric effect. Although the piezoelectric effect and polarization switching have been investigated for decades there has been no direct nanosecond-scale visualization of these phenomena in solid crystalline ferroelectrics. Synchrotron x-rays allow the polarization switching and the crystal lattice distortion to be visualized in space and time on scales of hundreds of nanometers and hundreds of picoseconds using ultrafast x-ray microdiffraction. Here we report the polarization switching visualization and polarization domain wall velocities for Pb(Zr0.45Ti0.55)O3 thin film ferroelectric capacitors studied by time-resolved x-ray microdiffraction.

Keywords

ferroelectricityx-ray diffraction (XRD)nanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 902: Symposium T – Ferroelectric Thin Films XIII , 2005 , 0902-T06-09
Copyright
Copyright © Materials Research Society 2006

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