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Structural Characterization of Fullerene thin Films Fabricated by Organic Molecular Beam Deposition

Published online by Cambridge University Press:  15 February 2011

Kiyoshi Yase ,
Takuya Saraya  and
Kazuhiro Kudo
Kiyoshi Yase
Affiliation:
National Institute of Materials and Chemical Research 1–1 Higashi, Tsukuba, Ibaraki 305, Japan
Takuya Saraya
Affiliation:
Department of Engineering, Chiba University, 1–33 Yayoi-cho, Inage-ku, Chiba 263, Japan
Kazuhiro Kudo
Affiliation:
Department of Engineering, Chiba University, 1–33 Yayoi-cho, Inage-ku, Chiba 263, Japan
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Abstract

Fullerene C60 thin solid films have been fabricated on the (001) surfaces of alkali halides (NaCl, KCI and KBr) and muscovite by organic molecular beam deposition (OMBD) technique. Pure C60 powder was sublimated from the precisely temperature-controlled K-cell at low pressure (10−7 Torr) and deposited onto the substrates kept in the range 125 –300 °C. Increasing both the temperature of K-cell and the substrate temperature, fine crystals grow with different size, shape and distance between neighbors. The dependence of the size and density of island crystals on the deposition conditions revealed the mechanism of crystal growth and the effect of interaction between molecules and substrate surface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 359: Symposium G – Science and Technology of Fullerene Materials , 1994 , 417
Copyright
Copyright © Materials Research Society 1995

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