Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T02:06:22.294Z Has data issue: false hasContentIssue false

Structural Characterization of Epitaxial GMR Magnetic Multilayers and Spin Valves Grown by Sputter Deposition

Published online by Cambridge University Press:  14 March 2011

H. Geng
Affiliation:
Department of Materials Science and Mechanics, Michigan State University, East Lansing, MI 48824-1226, U.S.A.
R. Loloee
Affiliation:
Department of Materials Science and Mechanics, Michigan State University, East Lansing, MI 48824-1226, U.S.A.
J.W. Heckman
Affiliation:
Department of Materials Science and Mechanics, Michigan State University, East Lansing, MI 48824-1226, U.S.A.
J. Bass
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824-1226, U.S.A.
W.P. Pratt Jr.
Affiliation:
Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824-1226, U.S.A.
M.A. Crimp
Affiliation:
Department of Materials Science and Mechanics, Michigan State University, East Lansing, MI 48824-1226, U.S.A.
Get access

Abstract

Epitaxial Cu/Py/FeMn and (Cu/Co)×20 GMR magnetic multilayers were grown on single crystal (011) Nb that was deposited on (1121) Al2O3 substrates by dc magnetron sputtering. Electron backscatter patterns (EBSPs) revealed that the Cu films display two twin variants, corresponding to two stacking sequences of {111} planes in fcc. The epitaxial orientation relationship between the bcc Nb and both fcc Cu variants was the Nishiyama-Wasserman (N-W) relationship. Conventional TEM observations revealed epitaxial growth for both the Cu/Py/FeMn and (Cu/Co)×20 multilayers. High-resolution TEM confirmed epitaxial growth of close packed (011) Nb on (1120) Al2O3 substrates with [111]Nb∥[0001]Al2O3. Numerous small twins were observed in the Cu near the Cu-Nb interface of the Cu/Py/FeMn multilayer. In the Cu/Co multilayer, the growth planes of the Cu and Co were found to be {100} instead of the expected close-packed {111} planes of the fcc structure.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Dieny, B., J. of Magn. Magn. Mater., 136, 335 (1994).10.1016/0304-8853(94)00356-4Google Scholar
2. Geng, H., Heckman, J.W., Pratt, W.P. Jr., Bass, J., Espinosa, F.J., Conradson, S.D., Lederman, D., and Crimp, M.A., J. Appl. Phys., 86(8), 4166 (1999).10.1063/1.371342Google Scholar
3. Loloee, R., Crimp, M.A., Zhu, W., and Pratt, W.P. Jr., Mat. Res. Soc. Symp. Proc., 528, 203 (1998).10.1557/PROC-528-203Google Scholar
4. Nishiyama, Z., Sci. Rept. Tohoku Univ., 23, 368 (1934).Google Scholar
5. Mitchell, T.E., Lu, Y.C., Griffin, A.J., Nastasi, M., and Kung, H., J. Am. Ceram. Soc., 80, 1673 (1997).10.1111/j.1151-2916.1997.tb03037.xGoogle Scholar
6. Loloee, R., Pratt, W.P. Jr., and Crimp, M.A. (accepted for publication (2/2000)byPhil. Mag. A).Google Scholar
7. Veirman, A.E.M. De, Hakkens, F.J.G., and Dirks, A.G., Ultramicroscopy, 51, 306 (1993).10.1016/0304-3991(93)90156-RGoogle Scholar