Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-05T03:02:11.268Z Has data issue: false hasContentIssue false

Structural and Optical Properties of PbTiO3 Grown on SrTiO3 Substrates by Peroxide MBE

Published online by Cambridge University Press:  26 February 2011

Natalia Izyumskaya
Affiliation:
[email protected], Virginia Commonwealth University, Department of Electrical and Computer Engineering, 601 West Main St., Richmond, VA, 23284, United States
Vitaliy Avrutin
Affiliation:
[email protected], Virginia Commonwealth University, Department of Electrical and Computer Engineering, 601 West Main St., Richmond, VA, 23284, United States
Xing Gu
Affiliation:
[email protected], Virginia Commonwealth University, Department of Electrical and Computer Engineering, 601 West Main St., Richmond, VA, 23284, United States
Umit Ozgur
Affiliation:
[email protected], Virginia Commonwealth University, Department of Electrical and Computer Engineering, 601 West Main St., Richmond, VA, 23284, United States
Tae Dong Kang
Affiliation:
[email protected], Kyung Hee University, Deptartment of Physics, Yong-In 446-701, Kyung Hee, N/A, Korea, Republic of
Hosun Lee
Affiliation:
[email protected], Kyung Hee University, Deptartment of Physics, Yong-In 446-701, Kyung Hee, N/A, Korea, Republic of
David John Smith
Affiliation:
[email protected], Arizona State University, Deptartment of Physics, A213 Mail code: 1704, Tempe, AZ, 85287, United States
Hadis Morkoc
Affiliation:
[email protected], Virginia Commonwealth University, Department of Electrical and Computer Engineering, 601 West Main St., Richmond, VA, 23284, United States
Get access

Abstract

Lead titanate (PbTiO3), a ferroelectric material with perovskite structure, has received a great deal of attention owing to a unique combination of its piezoelectric, pyroelectric, dielectric, electo- and acousto-optic properties [1–3]. PbTiO3 is a very attractive material for the use in a wide variety of fields, including ultrasonic sensors, infrared detectors, electro-optic modulators, and ferroelectric random access memories. To harness the intrinsic properties of PbTiO3 for device applications, however, high-quality epitaxial films are required. PbTiO3 thin films have been prepared by various methods such as chemical vapor deposition, rf magnetron sputtering, pulsed laser deposition, hydrothermal method, and sol-gel technique. Surprisingly, molecular beam epitaxy (MBE), with its precise control over composition, has not been widely applied, except of a few reports on MBE growth with the use of ozone as an oxidizing agent [4]. In the present work, high-quality single-crystal PbTiO3 layers were grown on (001) SrTiO3 substrates by MBE with the use of hydrogen peroxide as an oxidant [5]. Phase composition as well as structural and optical properties of the films were examined as a function of growth parameters by high-resolution x-ray diffractometry, spectroscopic ellipsometry, and photoluminescence. It was found that single-phase PbTiO3 films grew epitaxially at substrate temperatures above 600°C, whereas layers grown at lower temperature contained lead oxide inclusions. All the PbTiO3 layers were c-axis oriented with the epitaxial relationship PbTiO3(100)//SrTiO3(100) and PbTiO3[001]//SrTiO3[001]. No evidence of a-domains was found. Full width at half maximum of (001) rocking curves for 50–60 nm thick PbTiO3 layers are as low as 6–8 arcmin, indicating their good crystal quality. Pseudodielectric function of PbTiO3 was measured using variable angle spectroscopic ellipsometry at room temperature. Refractive index was found to be 2.605 at 633 nm (1.96 eV), which is consistent with the literature data. With the help of the standard critical point (SCP) lineshape analysis the band gap energy was calculated to be (3.778±0.005) eV.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Moulson, A.J., Herbert, J.M., Electroceramics, Second ed, Wiley, New York, 2003.Google Scholar
2. Li, Z., Foster, M., Guo, D., Zhang, H., Bai, G. R., Baldo, P. M., and Rehn, L. E., Appl. Phys. Lett. 65, 1106 (1994).Google Scholar
3. Dogheche, E., Jaber, B., and Remiens, D., Appl. Opt. 37, 4245 (1998).Google Scholar
4. Lee, K.S., Choi, J.H., Lee, J.Y., and Baik, S., J. Appl. Phys. 90, 4095 (2001).Google Scholar
5. Morita, T. and Cho, Y., Jpn. J. Appl. Phys., Part 1 43, 6535 (2004).Google Scholar
6. Chen, H. D., Udayakumar, K. R., Gaskey, C. J., and Cross, L. E., Appl. Phys. Lett. 67, 3411 (1995).Google Scholar
7. Theis, C. D. and Schlom, D. G., J. Cryst. Growth 174, 473 (1997).Google Scholar
8. Theis, C. D., Yeh, J., Schlom, D. G., Hawley, M. E., and Brown, G. W., Thin Solid Films 325, 107 (1998).Google Scholar
9. Izyumskaya, N., Avrutin, V., Schoch, W., El-Shaer, A., Reuss, F., Gruber, Th., and Waag, A., J. Cryst. Growth 269, 356 (2004).Google Scholar
10. Keijser, M. de, Leeuw, D.M. de, Veldhoven, P.J. van, Veirman, A.E.M. De, Neerinck, D.G., and Dormans, G.J.M., Thin Solid Films 266, 157 (1995).Google Scholar
11. CRC Handbook of Chemistry and Physics, ed. Lide, D.R., 86th ed. (CRC Press, Boca Raton, 20052006).Google Scholar
12. Glazer, A. M. and Mabud, S. A., Acta Cryst. B 34, 1065 (1978).Google Scholar
13. Johs, B., Herzinger, C. M., Dinan, J. H., Cornfeld, A., and Benson, J. D., Thin Solid Films 313/314, 137 (1998).Google Scholar
14. Thacher, P. D., Appl. Optics 16, 3210 (1977).Google Scholar
15. Lautenschlager, P., Garriga, M., Viña, L., and Cardona, M., Phys. Rev. B 36, 4821 (1987), and references therein.Google Scholar
16. Lee, Hosun, Kang, Youn-Seon, Cho, Sang-Jun, Xiao, Bo, Morkoç, Hadis, Kang, Tae Dong, Li, Jingbo, Wei, Su-Hwai, Snyder, P. J., and Evans, J. T., J. Appl. Phys. 98, 094108 (2005).Google Scholar