Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-19T08:37:01.542Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural and Morphological Study of Zirconia and Titania Sol-Gel Monolayered Films Supported on Soda-Lime Glass Substrates

Published online by Cambridge University Press:  01 February 2011

Luisa F. Cueto ,
Enrique Sánchez ,
Leticia M. Torres-Martínez  and
Gustavo A. Hirata
Luisa F. Cueto
Affiliation:
Facultad de Ciencias Químicas, División de Estudios Superiores Universidad Autónoma de Nuevo León, A.p. 1864, Monterrey N.L., México
Enrique Sánchez
Affiliation:
Facultad de Ciencias Químicas, División de Estudios Superiores Universidad Autónoma de Nuevo León, A.p. 1864, Monterrey N.L., México
Leticia M. Torres-Martínez
Affiliation:
Facultad de Ciencias Químicas, División de Estudios Superiores Universidad Autónoma de Nuevo León, A.p. 1864, Monterrey N.L., México
Gustavo A. Hirata
Affiliation:
Centro de Ciencias de la Materia Condensada Universidad Nacional Autónoma de México Km. 107 Carr. Tij.-Ens., Ensenada B.C., 22860, México
Get access

Abstract

Sol-Gel, dip-coated titaniumIV and zirconiumIV dioxide monolayered films were deposited on soda-lime glass using titanium and zirconium acetylacetonates as precursors, respectively, and their structural and morphological characterization carried out. The films were heat-treated at different temperatures, 25°C, 150°C, 300°C, and 500°C and, according to Low-angle X-Ray Diffraction analyses (XRD), it was found that TiO2 (anatase) and tetragonal zirconia were present on the substrate, when heated at 500°C. Yoshida and Yajima's method, based on optical information given by the films transmittance UV-Vis spectra, was used to estimate film thickness, refractive index, and, using the Lorentz-Lorentz relationship, their volume fraction. Film thinning and phase formation with increasing temperature was observed, and both titania and zirconia films showed similar behavior during firing. Smooth films with a roughness value of around 2 nm are obtained for the two cases as indicated by Atomic Force Microscopy (AFM) of the surface. Also, formation temperature at around 500°C resulted in the optimum condition to obtain clean stoichiometric TiO2 and ZrO2 thin films on glass substrates as confirmed by X-Ray Photoelectron Spectroscopy (XPS) measurements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 782: Symposium A – Micro- and Nanosystems , 2003 , A5.36
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Takahashi, Y., Ohsugi, A., Arafuka, T., Ohya, T., Ban, T., and Ohya, Y.. J. of Sol-Gel Sci. and Tech. 17 (2000) 227.Google Scholar
2. Smith, D.L., in “Thin-Film Deposition. Principles and Practice”. (McGraw-Hill, Inc., New York: 1995) p. 1 Google Scholar
3. Watanabe, T., Fukuyama, S., Miyauchi, M., Fujishima, A., and Hashimoto, K.. J. of Sol-Gel Sc. and Tech. 19 (2000) 71.Google Scholar
4. Blount, M.C., Kim, D.H., and Falconer, J.L.. Environ. Sci. Technol. 35 (2001) 2988.Google Scholar
5. Zorn, M.E., Tompkins, D.T., Zeltner, W.A., and Anderson, M.A.. Environ. Sci. Tech. 34 (2000) 5206 Google Scholar
6. Ohya, T., Nakayama, A., Ban, T., Ohya, Y. and Takahashi, Y.. J. of Sol-Gel Sci. and Tech. 14 (2002) 3082.Google Scholar
7. Tada, H. and Tanaka, M., Langmuir 13 (1997) 360.Google Scholar
8. Hirata, G.A., McKittrick, J., Avalos-Borja, M., Siqueiros, J.M., and Devlin, D.. Appl. Surf. Sci. 113/114 (1997) 509.Google Scholar
9. Marshall, D., Shaw, M., Dauskardt, R., Ritchie, R., Ready, M., and Heuer, A.. J. Amer. Cer. Soc. 73 (1990) 2659.Google Scholar
10. Tanabe, K. and Yamaguchi, T.. Catal. Today. 20 (1994) 185.Google Scholar
11. Ohya, T., Kabata, M., Ban, T., Ohya, Y., and Takahashi, Y.. J. of Sol-Gel Science and Tech. 25 (2002) 43.Google Scholar
12. Yoshida, S. and Yajima, G. in “Optical Thin Films and Devices”. (University of Tokyo Press: Tokyo, 1994).Google Scholar
13. Barsoum, M.W. in “Fundamentals of Ceramics”. (Institute of Physics Publishing Ltd: Cornwall, 2003), p. 558.Google Scholar
14. Watanabe, T., Fukuyama, S., Miyauchi, M., Fujishima, A. and Hashimoto, K.. J. of Sol-gel Science and Tech. 19 (2000) 71.Google Scholar
15. Moulder, J.F., Stickle, W.F., Sobol, P.E., and Bomben, K.D. in “Handbook of X-Ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data”. (Perkin-Elmer Corporation – Physical Electronics Division: Eden Prairie, 1993).Google Scholar