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Structural and Electronic Properties of Damaged Fullerite Crystals

Published online by Cambridge University Press:  15 February 2011

M. Manfredini ,
S. Serra ,
L. Colombo  and
P. Milani
M. Manfredini
Affiliation:
Dipartimento di Fisica, Universita' di Milano, via Celoria 16, 1-20133 Milano, (Italy)
S. Serra
Affiliation:
Dipartimento di Fisica, Universita' di Milano, via Celoria 16, 1-20133 Milano, (Italy)
L. Colombo
Affiliation:
Dipartimento di Fisica, Universita' di Milano, via Celoria 16, 1-20133 Milano, (Italy)
P. Milani
Affiliation:
Dipartimento di Fisica, Universita' di Milano, via Celoria 16, 1-20133 Milano, (Italy)
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Abstract

A structural tranfsormation of C60 crystals has been induced by high fluence laser irradiation under various chemical environments. The role of oxygen in driving fullerene cage opening reactions is investigated. The resulting material, showing features typical of low density amorphous carbon, has been characterized by Raman spectroscopy. In order to provide an atomistic model of the damaged sample, we have simulated the irradiation process by a tight binding molecular dynamics calculation on a 240-atoms system. We have carefully investigated the structural and electronic properties. In particular, the short- and medium-range features have been related to the cage opening, which is here modeled as a sequence of bond breakings.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 359: Symposium G – Science and Technology of Fullerene Materials , 1994 , 475
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

[1] Werner, H., Bloecker, J., Goebel, U., Henschke, B., Bensch, W. and Schloegl, R., Angew. Chem. 31, 868 (1992)Google Scholar
[2] Ito, A., Morikawa, T., and Takahashi, T., Chem. Phys. Lett. 211, 333 (1993)Google Scholar
[3] Manfredini, M., Bottani, C.E., and Milani, P., Chem. Phys. Lett. 226, 600 (1994); this volumeGoogle Scholar
[4] Meinardi, F., Paleari, A., Manfredini, M., and Milani, P., Solid State Commun., in press.Google Scholar
[5] Manfredini, M., and Milani, P., Appl. Phys. Lett., to be published.Google Scholar
[6] matus, M., and Kuzmany, H., Appl. Phys. A56, 241 (1993)Google Scholar
[7] Wurz, P., and Lykke, K., J. Phys. Chem. 96, 3332 (1992)Google Scholar
[8] Elman, B.S., Dresselhaus, M.S., Dresselhaus, G., Maby, E.W., and Mazurek, H., Phys. Rev. B24, 1027 (1981), and references therein.Google Scholar
[9] Goodwin, L., J. Phys.: Condens. Matter 3, 3869 (1991)Google Scholar
[10] Xu, C.H., Wang, C.Z., Chan, C.T. and Ho, K.M., J. Phys.: Condens. Matter 4, 6047 (1992)Google Scholar
[11] Serra, S., Molteni, C., Colombo, L. and Miglio, L., submitted for publicationGoogle Scholar
[12] Franzblau, D.S., Phys. Rev. B44, 4925 (1991)Google Scholar
[13] Wang, C.Z., Ho, K.M. and Chan, C.T., Phys. Rev. Lett. 70, 611 (1993)Google Scholar
[14] Wesner, D. et al. , Phys. Rev. B28, 2152 (1983)Google Scholar