Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-27T01:30:10.205Z Has data issue: false hasContentIssue false

Structural and Elastic Response of Mo/Ni Multilayers to Ion Irradiation

Published online by Cambridge University Press:  14 March 2011

Jérôme Pacaud
Affiliation:
Laboratoire de Métallurgie Physique, UMR CNRS 6630, Université de Poitiers, Ave Marie et Pierre Curie, BP 30179, 86962 Chasseneuil Cedex, France
Franck Martin
Affiliation:
Laboratoire de Métallurgie Physique, UMR CNRS 6630, Université de Poitiers, Ave Marie et Pierre Curie, BP 30179, 86962 Chasseneuil Cedex, France
Anny Michel
Affiliation:
Laboratoire de Métallurgie Physique, UMR CNRS 6630, Université de Poitiers, Ave Marie et Pierre Curie, BP 30179, 86962 Chasseneuil Cedex, France
Christiane Jaouen
Affiliation:
Laboratoire de Métallurgie Physique, UMR CNRS 6630, Université de Poitiers, Ave Marie et Pierre Curie, BP 30179, 86962 Chasseneuil Cedex, France
Philippe Djemia
Affiliation:
Laboratoire des Propriétés Mécaniques et Thermodynamiques des Matériaux, UPR CNRS 9001, Université Paris-Nord, Avenue J. B. Clément, 93430 Villetaneuse, France
François Ganot
Affiliation:
Laboratoire des Propriétés Mécaniques et Thermodynamiques des Matériaux, UPR CNRS 9001, Université Paris-Nord, Avenue J. B. Clément, 93430 Villetaneuse, France
Get access

Abstract

Mo/Ni multilayers are investigated by x-ray diffraction and Brillouin light scattering before and after ion induced stress relaxation and mixing. Study of the evolution of interplanar distances in both layers as a function of the period exhibits a strong anomaly of the Mo (110) distance (in the growth direction) that can be correlated with the elastic anomaly. The very low interplanar distance in the molybdenum layers found after stress relaxation seems to favor an explanation of this behavior based on the diffusion of Ni in the Mo layers during the growth.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Schuller, I.K., Fartash, A., and Grimsditch, M., MRS Bull. 1990, XV (10), 3337.10.1557/S0883769400058644Google Scholar
[2] Khan, M.B., Chun, C.S.L., Felcher, G.P., Grimsditch, M., Kueny, A., Falco, C. M. and Schuller, I.K., Phys. Rev. B 27 (1983) 71867193.10.1103/PhysRevB.27.7186Google Scholar
[3] Clemens, B.M. and Eesley, G.L., Phys. Rev. Letters, 61 (1988) 23562359.10.1103/PhysRevLett.61.2356Google Scholar
[4] Richardson, G., Makous, J.L., Yu, H.Y., and Edelstein, A.S., Phys. Rev.B, 45 (1992) 1211412117.10.1103/PhysRevB.45.12114Google Scholar
[5] Bain, J.A., Chyung, L.J., Brennan, S. and Clemens, B.M., Phys. Rev. B 44 (1991) 11841192.10.1103/PhysRevB.44.1184Google Scholar
[6] Jankowski, A.F. and Tasalakos, T. J. Phys F, 15 (1985) 1279.10.1088/0305-4608/15/6/013Google Scholar
[7] Cammarata, R.C. and Sieradzki, K., Phys. Rev. Letters 62(1989)2005.10.1103/PhysRevLett.62.2005Google Scholar
[8] Pickett, W.E., J. Phys. F, 12(1982) 2195.10.1088/0305-4608/12/10/014Google Scholar
[9] Wu, T.B., J. Appl. Phys., 53 (1982) 5265.10.1063/1.331361Google Scholar
[10] Hubermann, M.L. and Grimsditch, M., Phys. Rev. Letters 62 (1989) 1403.10.1103/PhysRevLett.62.1403Google Scholar
[11] Wolf, D. and Lutzko, J.F., Phys. Rev. Letters, 60 (1989) 1170 10.1103/PhysRevLett.60.1170Google Scholar
[12] Jaszczak, J.A., Phillpot, S.R. and Wolf, D., J. Appl. Phys. 68 (1990) 4573.10.1063/1.346164Google Scholar
[13] Fullerton, E.E., Schuller, I.K., Vanderstraeten, H. and Bruyneseraede, Y., Phys. Rev. B 45(1992) 9292.10.1103/PhysRevB.45.9292Google Scholar
[14] Musgrave, M. J. P.. Crystal acoustic. Holden Day, San Francisco (1970).Google Scholar
[15] Grimsditch, M., Phys. Rev. B 31 (1985) 6818.10.1103/PhysRevB.31.6818Google Scholar
[16] Badawi, K.F., Goudeau, P., Pacaud, J., Jaouen, C., Delafond, J., Naudon, A. and Gladyszewski, G., Nucl. Instr. Meth. B 80/81 (1993) 404 10.1016/0168-583X(93)96149-7Google Scholar