Investigations of the mechanical behavior of materials used in magnetic recording is of considerable practical importance in order to assure reliable file performance. With this objective, we have investigated the magnitude of the internal stresses observed in four sputtered thin film materials typically used in magnetic recording. First, the magnitude of the stresses observed in sputtered carbon films with and without hydrogen were measured and the nature of stress relaxation and thermal stability in different ambicnts were investigated. Second, the magnitude of the internal stress in CoPtCr magnetic media with and without a Cr-based sublayer that enhances magnetic performance was examined. Finally, the magnitude of stresses typically observed in thicker sputtered films of alumina were investigated both at room temperature and at elevated temperatures. The magnitude of the stresses observed in these sputtered films and their influence on mechanical performance are discussed.