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Stress Driven Rearrangement Instability of Crystalline Films with Electromechanical Interaction

Published online by Cambridge University Press:  01 February 2011

Peter Chung ,
John Clayton ,
Melanie M Cole ,
Michael Grinfeld ,
Pavel Grinfeld  and
William Nothwang
Peter Chung
Affiliation:
[email protected], US Army Research Laboratory, AMSRD-ARL-CI-HC, Aberdeen Proving Ground, MD, 21005-5069, United States
John Clayton
Affiliation:
[email protected], US Army Research Laboratory, AMSRD-ARL-WM-TD, Aberdeen Proving Ground, MD, 21005-5069, United States
Melanie M Cole
Affiliation:
[email protected], US Army Research Laboratory, AMSRD-ARL-WM-MA, Aberdeen Proving Ground, MD, 21005-5069, United States
Michael Grinfeld
Affiliation:
[email protected], US Army Research Laboratory, AMSRD-ARL-WM-TD, 4600 Deer Creek Loop, Aberdeen Proving Ground, MD, 21005-5069, United States
Pavel Grinfeld
Affiliation:
[email protected], Drexel University, Mathematics Department, Philadelphia, PA, 19104, United States
William Nothwang
Affiliation:
[email protected], US Army Research Laboratory, AMSRD-ARL-CI-HC, Aberdeen Proving Ground, MD, 21005-5069, United States
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Abstract

It was demonstrated, on general thermodynamic grounds, that, in non-hydrostatically stressed elastic systems, phase and grain interfaces undergo morphological destabilization due to different mechanisms of “mass rearrangement”. Destabilization of free surfaces due to the combined action of mass rearrangement in the presence of electrostatic field has been well known since the end of the 19th century. Currently, morphological instabilities of thin solid films with electro-mechanical interactions have found various applications in physics and engineering. In this paper, we investigate the combined effects of the stress driven rearrangement instabilities and the destabilization due to the electro-mechanical interactions. The paper presents relevant results of theoretical studies for ferroelectric thin films. Theoretical analysis involves highly nonlinear equations allowing analytical methods only for the initial stage of unstable growth. At present, we are unable to explore analytically the most important, deeply nonlinear regimes of growth. To avoid this difficulty, we developed numerical tools facilitating the process of solving and interpreting the results by means of visualization of developing morphologies.

Keywords

ferroelectricmorphologyself-assembly
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 924: Symposium Z – Mechanics of Nanoscale Materials and Devices , 2006 , 0924-Z07-04
Copyright
Copyright © Materials Research Society 2006

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