Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-27T01:30:15.013Z Has data issue: false hasContentIssue false
  • English
  • Français

Stem Observations of the Microstructures Present in Polymer Blend Thin Films.

Published online by Cambridge University Press:  26 February 2011

K. E. Sickafus ,
S. D. Berger  and
A. M. Donald
K. E. Sickafus
Affiliation:
University of Cambridge, Cavendish Laboratory, Cambridge CB3 01E, U. K.
S. D. Berger
Affiliation:
University of Cambridge, Cavendish Laboratory, Cambridge CB3 01E, U. K.
A. M. Donald
Affiliation:
University of Cambridge, Cavendish Laboratory, Cambridge CB3 01E, U. K.
Get access

Abstract

This paper examines the effectiveness of scanning transmission electron microscopy (STEM) as an analytical tool for determining composition in multi-phase polymer blend microstructures. The polymer blend polystyrene (PS) - polyether sulphone (PES) thin film used in this study exhibited a two-phase microstructure consisting of PES-rich inclusions, ranging from 0.2μm to 1.2μm in diameter, in a PS-rich matrix. Emphasis in this presentation is placed on the use of annular dark-field (ADF) STEM image contrast to infer information concerning the local composition of adjacent microstructural features.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 79: Symposium F – Scattering, Deformation and Fracture in Polymers , 1986 , 115
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Pennycook, S.J., Berger, S.D., and Culbertson, R.J., submitted to Journal of Microscopy.Google Scholar
2. Andree, P.J., Mellema, J.E., and Ruigrok, R.W.H., Ultramicroscopy 17 (1985) 237–242.Google Scholar
3. Sickafus, K.E., Berger, S.D., and Donald, A.M., to be submitted for publication.Google Scholar
4. Colliex, C., in Advances in Optical and Electron Microscopy, 9, eds. Barer, R. and Cosslett, V.E., Academic Press, London and New York, 1984.Google Scholar