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Steady State and Transient Capacitance Measurements of the Energy Levels of a Low Angle Tilt Boundary in a Germanium Bicrystal

Published online by Cambridge University Press:  15 February 2011

A. Broniatowski  and
J.C. Bourgoin
A. Broniatowski
Affiliation:
C.N.R.S., Laboratoire P.M.T.M., Avenue J.B. Clèment, 93430 Villetaneuse (France)
J.C. Bourgoin
Affiliation:
Groupe de Physique des Solides de l'E.N.S., Universitè Paris 7, 2, place Jussieu, 75251 Paris Cedex 05, (France)
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Abstract

Steady state and transient capacitance (DLTS) measurements have been performed on a low angle tilt boundary in a germanium bicrystal, in combination with an electron microscope study of the boundary dislocation structure. A characteristic level has been found at 0.42 eV below the bottom of the conduction band, with a density about 109 cm-2 and an electronic capture cross-section about 5 × 10-12 cm2.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 5: Symposium B – Grain Boundaries in Semiconductors , 1981 , 119
Copyright
Copyright © Materials Research Society 1982

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References

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