Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-19T20:39:42.914Z Has data issue: false hasContentIssue false

Stark Splitting in Photoluminescence Spectra of Er in a-Si:H

Published online by Cambridge University Press:  01 February 2011

Minoru Kumeda
Affiliation:
Division of Electrical Engineering and Computer Science, Graduate School of Natural Science & Technology, Kanazawa University
Mitsuo Takahashi
Affiliation:
Division of Electrical Engineering and Computer Science, Graduate School of Natural Science & Technology, Kanazawa University
Akiharu Morimoto
Affiliation:
Division of Electrical Engineering and Computer Science, Graduate School of Natural Science & Technology, Kanazawa University
Tatsuo Shimizu
Affiliation:
NTT Microsystem Integration Labs., Atsugi 243-0198, Japan.
Get access

Abstract

The photoluminescence spectra due to Er ions doped in a-Si:H were decomposed into several lines. The 19-K spectrum was reproduced by adding four Gaussian lines whose linewidths were increased with decreasing the photon energy. Since only the lowest energy level of 4I13/2 contributes to the radiative transition at this low temperature, the energy levels in 4I15/2 split by the Stark effect can be determined. These splittings are not largely different from those for Er in aluminosilicate glass. This implies that the all nearest neighbors of Er are oxygens which have been introduced unintentionally in the sample during preparation. The change in the photoluminescence intensity by annealing is discussed in relation with the spectral change and the results of ESR measurements.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Polman, A., J. Appl. Phys. 82, 1 (1997).10.1063/1.366265Google Scholar
2 Yassievich, I., Bresler, M. and Gusev, O., J. Non-Cryst. Solids 226, 192 (1998).10.1016/S0022-3093(98)00357-3Google Scholar
3 Fuhs, W., Ulber, I., Weiser, G., Bresler, M. S., Gusev, O. B., Kuznetsov, A. N., Kudoyarova, V. Kh., Terukov, E. I. and Yassievich, I. N., Phys. Rev. B 56, 9545 (1997).10.1103/PhysRevB.56.9545Google Scholar
4 Desurvire, D. and Simpson, J. R., Opt. Lett. 15, 547 (1990).10.1364/OL.15.000547Google Scholar
5 Wortman, D. E., Morrison, C. A. and Bradshaw, J. L., J. Appl. Phys. 82, 2580 (1997).10.1063/1.366069Google Scholar
6 Huang, C., McCaughan, L. and Gill, D. M., J. Lightwave Technol. 12, 803 (1994).10.1109/50.293972Google Scholar
7 Masterov, V. F., Nasredinov, F. S., Seregin, P. P., Kudoyarova, V. Kh., Kuznetsov, A. N. and Terukov, E. I., Appl. Phys. Lett. 72, 728 (1998).10.1063/1.120866Google Scholar
8 Tessler, L. R., Piamonteze, C., Alves, M. C. M. and Tolentino, H., J. Non-Cryst. Solids 266-269, 598 (2000).10.1016/S0022-3093(99)00750-4Google Scholar