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Stabilization of Transverse Mode Emission in Vertical-Cavity Surface-Emitting Lasers by Deposition of High Refractive Index Amorphous Gaas

Published online by Cambridge University Press:  10 February 2011

Hyo-Hoon Park ,
Byueng-Su Yoo ,
Hye Yong Chu ,
El-Hang Lee ,
Min Soo Park ,
Byung Tae Ahn ,
Jae-Heon Shin  and
Yong Hee Lee
Hyo-Hoon Park
Affiliation:
Electronics and Telecommunications Research Institute, P.O. Box 106, Yusong, Taejon, 305–600, Korea
Byueng-Su Yoo
Affiliation:
Electronics and Telecommunications Research Institute, P.O. Box 106, Yusong, Taejon, 305–600, Korea
Hye Yong Chu
Affiliation:
Electronics and Telecommunications Research Institute, P.O. Box 106, Yusong, Taejon, 305–600, Korea
El-Hang Lee
Affiliation:
Electronics and Telecommunications Research Institute, P.O. Box 106, Yusong, Taejon, 305–600, Korea
Min Soo Park
Affiliation:
Korea Advanced Institute of Science and Technology, Yusong, Taejon, 305–701, Korea
Byung Tae Ahn
Affiliation:
Korea Advanced Institute of Science and Technology, Yusong, Taejon, 305–701, Korea
Jae-Heon Shin
Affiliation:
Korea Advanced Institute of Science and Technology, Yusong, Taejon, 305–701, Korea
Yong Hee Lee
Affiliation:
Korea Advanced Institute of Science and Technology, Yusong, Taejon, 305–701, Korea
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Abstract

We report successful application of a low-temperature-grown amorphous GaAs (a-GaAs) layer for stabilization of the fundamental transverse mode of InGaAs/GaAs vertical-cavity surface-emitting lasers. The maximum currents maintaining a stable fundamental transverse mode were increased by the antiguide effect of a-GaAs with a high refractive index. For 10-μm- and 15-μm-diameter devices, we attained a stable single-mode emission over a wide range of current. The antiguiding of transverse modes in vertical cavity buried in the high refractive cladding layer was calculated using a two-dimensional beam propagation method.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 421: Symposium D – Compound Semiconductor Electronics and Photonics , 1996 , 75
Copyright
Copyright © Materials Research Society 1996

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