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Spectroscopic Evidence for Cluster Emission from Laser Ablated Surface in Group IV Elements

Published online by Cambridge University Press:  16 February 2011

A. Kasuya  and
Y. Nishina
A. Kasuya
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980, Japan
Y. Nishina
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980, Japan
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Abstract

Transient process of laser ablation has been investigated by space/ time-resolved optical spectrometry. An excimer laser excitation on crystal surfaces of group IV elements produces highly excited microclusters of atoms which continue to absorb laser energy and begin to decompose in time scale of nanosecond. The spectral characteristics indicate that they are highly charged and decompose dominantly through ejections of neutral or singly charged monomers of constituent element rather than fragmentation into smaller clusters like a fission process.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 191: Symposium N – Laser Ablation for Materials Synthesis , 1990 , 73
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

[1] Kasuya, A. and Nishina, Y., Z. Phys. D12, 493 (1989).Google Scholar
[2] Kasuya, A. and Nishina, Y., Mat. Res. Symp. Proc. Vol.129 (Materials Research Society.Pittsburgh, 1989) p. 365.Google Scholar
[3] Kasuya, A. and Nishina, Y., Physics and Chemistry of Small Particles. NATO ASI Series B158 ed. by Jena, P., Rao, B.K., and Kanna, S.J. (Plenum, New York, 1987) p. 299.Google Scholar
[4] Griem, H.R., Plasma Spectroscopy (McGrow-Hill, New York, 1964) p. 483.Google Scholar
[5] Wavelength, M.I.T. Tables Vol. 2 (M.I.T. Press, Cambridge, 1982).Google Scholar
[6] Pian, T.R., Tolk, N.H., Traum, M.M. and Kraus, J., Surface Sci. 129, 573 (1983).Google Scholar
[7] Baldron, C., Lopez, J.M., Iniguez, M.P., and Alonso, J.A., Z. Phys. D11, 323 (1989).Google Scholar
[8] Eryu, O., Murakami, K., Masuda, K., Kasuya, A. and Nishina, Y., Appl. Phys. Lett., 54,(26) 2716 (1989).Google Scholar