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SPA Monitoring of GaN Movpe Surface

Published online by Cambridge University Press:  10 February 2011

Naoki Kobayashi
Affiliation:
NTT Basic Research Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-01, Japan
Yasuyuki Kobayashi
Affiliation:
NTT Basic Research Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-01, Japan
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Abstract

For the purpose of clarifying the growth mechanism of GaN metal-organic vapor phase epitaxy (MOVPE), the GaN surface during the growth on the (0001) sapphire substrate were in-situ monitored by surface photo-absorption (SPA) method. Ga-rich and N-rich surfaces can be distinguished by their reflectivities. It is found that the surface stoichiometry changes with the substrate temperature and with the carrier gas. In the nitrogen carrier gas, a N-rich GaN surface is stably formed at temperatures up to about 1000°C under NH3 flow. In contrast, the surface in H2 carrier gas is N-rich below 720°C, but becomes Ga-rich above 850°C. The desorption kinetics indicates that H2 enhances the N desorption.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1. Aspnes, D. E., Harbison, J. P., Studna, A. A., and Florez, L. T., Phys. Rev. Lett., 59, p. 1687, (1987).Google Scholar
2. Kobayashi, N. and Horikoshi, Y., Jpn. J. Appl. Phys., 28, p. L1880, (1989).Google Scholar
3. Kobayashi, N., Kobayashi, Y., and Uwai, K., J. Crystal Growth, 170, p. 225, (1997).Google Scholar
4. Yamauchi, Y., Uwai, K., and Kobayashi, N., Jpn. J. Appl. Phys., 32, p. 3363, (1993).Google Scholar
5. Kobayashi, Y. and Kobayashi, N., J. Electron. Mater., 25, p. 691, (1996).Google Scholar
6. Kobayashi, N., Kobayashi, Y., and Uwai, K., J. Crystal Growth, 174, p. 544, (1997).Google Scholar
7. Kobayashi, N. and Kobayashi, Y., Jpn. J. Appl. Phys., 30, p. L1699, (1991).Google Scholar
8. Schon, O., Schineller, B., Heuken, M., and Beccard, R., Proceedings of the 2nd Int. Conf. on Nitride Semiconductors, Oct 27˜31, 1997, Tokushima Japan, p. 172M.Google Scholar
9. Neugebauer, J., Zywietz, T., Scheffler, M., and Northrup, J. E., ibid, p. 216.Google Scholar
10. Nakamura, S. and Mukai, T., Jpn. J. Appl. Phys., 31, p. L1457, (1992).Google Scholar
11. Scholz, F., Harle, V., Steuber, F., Bolay, H., Dornen, A., Kaufmann, B., Syganow, V., and Hangleiter, A., J. Crystal Growth, 170, p. 321, (1997).Google Scholar