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Sol-gel synthesis and characterization of CuO–based nanosystems

Published online by Cambridge University Press:  11 February 2011

Lidia Armelao
Affiliation:
ISTM-CNR and INSTM –, Department of Chemistry - University of Padova–Italy.
Davide Barreca
Affiliation:
ISTM-CNR and INSTM –, Department of Chemistry - University of Padova–Italy.
Manuel Bertapelle
Affiliation:
INSTM and Department of Inorganic, Metallorganic and Analytical Chemistry –, University of Padova – Italy
Gregorio Bottaro
Affiliation:
INSTM and Department of Inorganic, Metallorganic and Analytical Chemistry –, University of Padova – Italy
Cinzia Sada
Affiliation:
INFM and Department of Physics –, University of Padova – Italy.
Eugenio Tondello
Affiliation:
INSTM and Department of Inorganic, Metallorganic and Analytical Chemistry –, University of Padova – Italy
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Abstract

This paper is focused on the sol-gel synthesis and characterization of CuO-based nanosystems both in the form of supported films and as guest nanoclusters embedded in a silica matrix. In both cases copper acetate (Cu(CH3COO)2 · H2O) was used as Cu source and, for the CuO :SiO2 nanocomposite systems, tetraethoxysilane (Si(OC2H5)4, TEOS) was adopted as silica precursor. Films were obtained by a dip-coating procedure and subsequently treated in air between 100 and 900°C. The system evolution on thermal annealing was studied by X-ray photoelectron spectroscopy (XPS), Glancing-Incidence X-ray diffraction (GIXRD) and optical absorption. Irrespective of the processing conditions, the formation of tenorite (CuO) crystallites with nanometric dimension was observed. In the nanocomposite samples, copper was homogeneously distributed in the host matrix and stable CuO nanoclusters (φ ≈ 15 nm) were obtained.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

Balamurugan, B., Mehta, B.R., Thin Solid Films 396 (2001) 90.Google Scholar
Marabelli, F., Parraviciny, G.B., Orioli, F.S., Phys. Rev. B 52 (1995) 1433.Google Scholar
Ghijsen, J., Tjeng, L.H., Elp, J.V., Eskes, H., Westerink, J., Sawatzky, G.A., Czyzyk, M.T., Phys. Rev. B 38 (1988) 11322.Google Scholar
[4] Oritz, J.R., Ogura, T., Medina-Valtierra, J., Acosta-Ortiz, S.E., Bosh, P., de las Reyes, J.A., Lara, V.H., Appl. Surf. Sci. 174 (2001) 177.Google Scholar
[5] Zhou, R., Yu, T., Jiang, X., Chen, F., Zheng, X., Appl. Surf. Sci. 148 (1999) 263.Google Scholar
[6] Saito, S., Miyayama, M., Kaumoto, K., Yanagida, H., J. Am. Ceram. Soc. 68 (1985) 40.Google Scholar
[7] Traversa, E., J. Int. Mater. Systems Struct. 6 (1995) 860.Google Scholar
[8] Ando, M., Kobayashi, T., Haruta, M., Catal. Today 36 (1997) 135.Google Scholar
[9] Ando, M., Kobayashi, T., Haruta, M., Sens. Actuators B 24–25 (1995) 851.Google Scholar
[10] Alivisatos, A.P., J. Phys. Chem. 100 (1996) 13226.Google Scholar
[11] Brookshire, M.A., Chusuei, C.C., Goodman, D.W., Langmuir 15 (1999) 2043.Google Scholar
[12] Ray, S.C., Solar Energy Materials & Solar Cells 68 (2001) 307.Google Scholar
[13] Armelao, L., Colombo, P., Fabrizio, M., Gross, S., Tondello, E., J. Mater. Chem. 9 (1999) 2893.Google Scholar
[14] Briggs, D., Seah, M.P., Practical Surface Analysis, vol. 1, John Wiley, Chichester, 1990.Google Scholar
[15] Moulder, J.M., Stickle, W.F., Sobol, P.E., Bomben, K.D., Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, Eden Prairie, MN, 1992.Google Scholar
[16] Armelao, L., Barreca, D., Bertapelle, M., Bottaro, G., Sada, C., Tondello, E., submittedGoogle Scholar
[17] JCPDS card no. 45–937, 1992.Google Scholar