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Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides.

Published online by Cambridge University Press:  11 February 2011

Kevin E. Smith
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Cormac McGuinness
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
James Downes
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Philip Ryan
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Dongfeng Fu
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Steven L. Hulbert
Affiliation:
National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973
J.M. Honig
Affiliation:
Department of Chemistry, Purdue University, West Lafayette, IN 47907, USA
Russel Egdell
Affiliation:
Inorganic Chemistry Laboratory, Oxford University, Oxford, UK.
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Abstract

This paper discusses the application of soft x-ray emission and resonant inelastic x-ray scattering as probes of the electronic structure of transition metal oxides. The results of studies on the narrow gap insulator CdO, and the Mott-Hubbard oxide Cr-doped V2O3, are reported. The O 2p valence band partial density of states for CdO has been measured, and emission due to the hybridization of the O 2p valence band states with Cd 4d shallow core level has been observed. For Cr-doped V2O3, the temperature induced metal-insulator transition in samples with 1.5% Cr was observed using soft x-ray emission, and both charge transfer and dipole forbidden d-d excitations were observed using resonant inelastic x-ray scattering.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

Photoemission in Solids, Parts 1 and 2, edited by Cardona, M. and Ley, L. (Springer Verlag, Berlin, 1978)Google Scholar
Smith, K.E., Ann. Rep. Prog. Chem. C 92, 253 (1996).Google Scholar
Smith, K.E., Solid State Sci. 4, 359 (2002);Google Scholar
Smith, K.E., Ann. Rep. Prog. Chem. C 90, 115 (1995);Google Scholar
Angle Resolved Photoemission, edited by Kevan, S.D. (Elsevier, Amsterdam, 1991)Google Scholar
Paratt, L.G., Rev. Mod. Phys. 31, 616 (1959).Google Scholar
5. Cowan, P.L., Physica Scripta T31, 112 (1990).Google Scholar
6. Callcott, T.A., Zhang, C.H., Ederer, D.L., Mueller, D.R., Rubensson, J.E., and Arakawa, E.T., Nucl. Instrum. Meth. A 291, 13 (1990);Google Scholar
Nordgren, J. and Wassdahl, N., Physica Scripta T31, 103 (1990).Google Scholar
7. Nordgren, J., Bray, G., Cramm, S., Nyholm, R., Rubensson, J.E., and Wassdahl, N., Rev. Sci. Instrum. 60, 1690 (1989).Google Scholar
8. Nordgren, J., J. Physique 48, 693 (1987).Google Scholar
9. Nordgren, J. and Nyholm, R., Nucl. Instrum. Meth. A 246, 242 (1986).Google Scholar
10. Dou, Y., Egdell, R.G., Law, D.S.L., Harrison, N.M., and Searle, B.G., J. Phys. - Cond. Matter 10, 8447 (1998).Google Scholar
11. Madelung, O., Landolt–Bornstein numerical data and functional relationships Semiconductors: Physics of II-VI and I-VII Compounds, Semimagnetic Semiconductors Science and Technology vol 17 (Springer, Berlin, 1984).Google Scholar
12. Smith, K.E., et al., Synchrotron Radiation News 15, 11 (2002);Google Scholar
Duda, L.C., Nordgren, J., Drager, G., Bocharov, S., and Kirchner, T., J. Elec. Spec. Related Phenom. 110–111, 275 (2000).Google Scholar
13. Goodenough, J.B., Prog. Solid State Chem. 5, 145 (1971).Google Scholar
14. Kuwamoto, H., Honig, J.M., and Appel, J., Phys. Rev. B 22, 2626 (1980).Google Scholar
15. McWhan, D.B. and Rice, T.M., Phys. Rev. Lett. 22, 887 (1969);Google Scholar
McWhan, D.B., Rice, T.M., and Remeika, J.P., Phys. Rev. Lett. 23, 1384 (1969).Google Scholar
16. Smith, K.E. and Henrich, V.E., Phys. Rev. B 50, 1382 (1994).Google Scholar
17. Smith, K.E. and Henrich, V.E., Phys. Rev. B 38, 5965 (1988);Google Scholar
Smith, K.E. and Henrich, V.E., Phys. Rev. B 38, 9571 (1988);Google Scholar
Smith, K.E. and Henrich, V.E., Solid State Comm. 68, 29 (1988).Google Scholar