Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-25T16:34:20.820Z Has data issue: false hasContentIssue false

Size Dependence of Bombardment Characteristics Produced by Cluster Ion Beams

Published online by Cambridge University Press:  10 February 2011

T. Seki
Affiliation:
Ion Beam Engineering Experimental Laboratory, Kyoto University, Sakyo Kyoto, Japan
M. Tanomura
Affiliation:
Ion Beam Engineering Experimental Laboratory, Kyoto University, Sakyo Kyoto, Japan
T. Aoki
Affiliation:
Ion Beam Engineering Experimental Laboratory, Kyoto University, Sakyo Kyoto, Japan
J. Matsuo
Affiliation:
Ion Beam Engineering Experimental Laboratory, Kyoto University, Sakyo Kyoto, Japan
I. Yamada
Affiliation:
Ion Beam Engineering Experimental Laboratory, Kyoto University, Sakyo Kyoto, Japan
Get access

Abstract

Cluster ion beam processes provide new surface modification techniques, such as surface smoothing, high rate sputtering and very shallow implantation, because of the unique interactions between cluster and surface atoms. To understand interactions with cluster and surface, Scanning Tunneling Microscope (STM) observations have been done for single impact traces.

Highly Oriented Pyrolitic Graphite (HOPG) surfaces were bombarded by carbon cluster ions (Va≤300kV), and large ridges and craters have been observed as a result of single cluster ion impact. The impact site diameters are proportional to the cluster size up to 10 atoms, and increase drastically for cluster sizes above 10. This indicates that non-linear multiple collisions occur only when a local area is bombarded by more than 10 atoms at the same time.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Yamada, I., Matsuo, J., Insepov, Z., Akizuki, M., Nucl. Instr. & Meth. B106 (1995) 165.Google Scholar
2. Yamada, I., Brown, W. L., Northby, J. A. and Sosnowski, M., Nucl. Instr. and Meth., B79 (1993) 223.Google Scholar
3. Takaoka, G. H., Sugawara, G., Hummel, R. E., Northby, J, A, Sosnowski, M. and Yamada, I., Mat. Res. Soc. Symp. Proc., 316 (1994) 1005.Google Scholar
4. Insepov, Z. Sosnowski, M. and Yamada, I., Advanced Materials '93 IV/Laser and Ion Beam Moditication of Materials, ed. I.Yamada et al, Trans. Mat. Res. Soc. Jpn. 17 (1994) 1110.Google Scholar
5. Seki, T., Kaneko, T., Takeuchi, D., Aoki, T., Matsuo, J., Insepov, Z. and Yamada, I., Nucl. Instr. and Meth0., B121 (1997) 498.Google Scholar
6. Takeuchi, D., Seki, T., Aoki, T., Matsuo, J. and Yamada, I., to be published in J. Mat. Chem. and Phys. (1998).Google Scholar
7. Bräuchle, G., Richard-Schneider, S., Illig, D., Beck, R. D., Schreiber, H. and Kappes, M. M., Nucl. Instr. and Meth., B112 (1996) 105.Google Scholar
8. Döbeli, M., Ames, F., Ender, R.M., Suter, M., synal, H. A. and Vetterli, D., Nucl. Instr. and Meth., B106 (1995) 43.Google Scholar
9. A. Hallen Hakanson, P., Keskitalo, N., Olsson, J., Brunelle, A., Della-Negra, S. and Le, Y. Beyec, Nucf. Instr. and Meth., B106 (1995) 233.Google Scholar
10. Seki, T., Aoki, T., Tanomura, M., Matsuo, J. and Yamada, I., to be published in J. Mat. Chem. and Phys. (1998).Google Scholar
11. Tanomura, M., Takeuchi, D., Matsuo, J., Takaoka, G. H. and Yamada, I., Nucl. Instr. and Meth., B121 (1997) 480.Google Scholar