Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-23T17:10:03.204Z Has data issue: false hasContentIssue false
  • English
  • Français

Size Controlled Synthesis of Silicon Nanocrystals within Inverse Micelles

Published online by Cambridge University Press:  15 May 2013

Keith Linehan  and
Hugh Doyle
Keith Linehan
Affiliation:
Tyndall National Institute, University College Cork, Lee Maltings, Cork, Ireland
Hugh Doyle
Affiliation:
Tyndall National Institute, University College Cork, Lee Maltings, Cork, Ireland
Get access

Abstract

Alkyl-terminated Si nanocrystals (NCs) are synthesized at room temperature by hydride reduction of SiCl4 within inverse micelles. Highly monodisperse Si NCs (2 – 6 nm) are produced by variation of the cationic quaternary ammonium salts used to form the inverse micelles. Transmission electron microscopy imaging confirms the NCs are highly crystalline, while FTIR spectra confirm that the NCs are passivated by covalent attachment of alkanes, with minimal surface oxidation. The photoluminescence intensity of the Si NCs exhibits an inverse relationship with the mean NC diameter, with a quantum yield of 12 % recorded for 2 nm NCs.

Keywords

Sinanostructurechemical synthesis
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1546: Symposium L – Nanoparticle Manufacturing, Functionalization, Assembly and Integration , 2013 , mrss13-1546-l06-48
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Mastronardi, M. L., Maier-Flaig, F., Faulkner, D., Henderson, E. J., Kübel, C., Lemmer, U. and Ozin, G. A., Nano Lett. 12, 337 (2012).CrossRefGoogle Scholar
Llansola Portolés, M. J., Pis Diez, R., Dell’arciprete, M. L., Caregnato, P., Romero, J. J., Mártire, D. O., Azzaroni, O., Ceolín, M. and Gonzalez, M. C., J. Phys. Chem. C. 116, 11315 (2012).CrossRefGoogle Scholar
Perraud, S., Quesnel, E., Parola, S., Barbé, J., Muffato, V., Faucherand, P., Morin, C., Jarolimek, K., Van Swaaij, R. A. C. M. M., Zeman, M., Richards, S., Kingsley, A., Doyle, H., Linehan, K., O'Brien, S., Povey, I. M., Pemble, M. E., Xie, L., Leifer, K., Makasheva, K. and Despax, B., Phys. Status Solidi A. DOI: 10.1002/pssa.201200533 (2012).Google Scholar
Kapaklis, V., Politis, C., Poulopoulos, P. and Schweiss, P., Appl. Phys. Lett. 87, 123114 (2005).CrossRefGoogle Scholar
Sato, S., Swihart, M. T., Chem. Mater. 18, 4083 (2006).CrossRefGoogle Scholar
Canham, L. T., Appl. Phys. Lett. 57, 1046 (1990).CrossRefGoogle Scholar
Holmes, J. D., Ziegler, K. J., Doty, R. C., Pell, L. E., Johnston, K. P. and Korgel, B. A., J. Am. Chem. Soc. 123, 3743 (2001).CrossRefGoogle Scholar
Shiohara, A., Prabakar, S., Faramus, A., Hsu, C.-Y., Lai, P.-S., Northcote, P. T. and Tilley, R. D., Nanoscale 3, 3364 (2011).CrossRefGoogle Scholar
Wilcoxon, J. P., Samara, G. A. and Provencio, P. N., Phys. Rev. B. 60, 2704 (1999).CrossRefGoogle Scholar
Tilley, R. D., Warner, J. H., Yamamoto, K., Matsui, I. and Fujimori, H., Chem. Commun. 1833 (2005).Google Scholar
Rosso-Vasic, M., De Cola, L. and Zuilhof, H., J. Phys. Chem. C. 113, 2235 (2009).CrossRefGoogle Scholar
Shiohara, A., Hanada, S., Prabakar, S., Fujioka, K., Lim, T. H., Yamamoto, K., Northcote, P. T. and Tilley, R. D., J. Am. Chem. Soc. 132, 248 (2010).CrossRefGoogle Scholar
Wang, J., Sun, S., Peng, F., Cao, L. and Sun, L., Chem. Commun. 47, 4941 (2011).CrossRefGoogle Scholar
Cheng, X., Gondosiswanto, R., Ciampi, S., Reece, P. J. and Gooding, J. J., Chem. Commun. 48, 11874 (2012).CrossRefGoogle Scholar
Williams, A. T. R., Winfield, S. A. and Miller, J. N., Analyst 108, 1067 (1983).CrossRefGoogle Scholar
Rosso-Vasic, M., Spruijt, E., Van Lagen, B., De Cola, L. and Zuilhof, H., Small 4, 1835 (2008).CrossRefGoogle Scholar
Warner, J. H., Rubinsztein-Dunlop, H. and Tilley, R. D., J. Phys. Chem. B. 109, 19064 (2005).CrossRefGoogle Scholar
Yang, C.-S., Bley, R. A., Kauzlarich, S. M., Lee, H. W. H. and Delgado, G. R., J. Am. Chem. Soc. 121, 5191 (1999).CrossRefGoogle Scholar
Veinot, J. G. C., Chem. Commun, 40, 4160 (2006).CrossRefGoogle Scholar
Yang, S., Li, W., Cao, B., Zeng, H. and Cai, W., J. Phys. Chem. C. 115, 21056 (2011).CrossRefGoogle Scholar
Lin, S.-W. and Chen, D.-H., Small 5, 72 (2009).CrossRefGoogle Scholar
Warner, J. H., Hoshino, A., Yamamoto, K. and Tilley, R. D., Angew. Chem., Int. Ed. 44, 4550 (2005).CrossRefGoogle Scholar