Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-17T18:15:06.917Z Has data issue: false hasContentIssue false

Siox Related Photoluminescence Excitation in Porous Silicon

Published online by Cambridge University Press:  15 February 2011

T. V. Torchinskaya
Affiliation:
Institute of Semiconductor Physics, National Ukrainian Academy of Sciences, 252028, Kiev, UKRAINE
N. E. Korsunskaya
Affiliation:
Institute of Semiconductor Physics, National Ukrainian Academy of Sciences, 252028, Kiev, UKRAINE
B. R. Dzumaev
Affiliation:
Institute of Semiconductor Physics, National Ukrainian Academy of Sciences, 252028, Kiev, UKRAINE
M. K. Sheinkman
Affiliation:
Institute of Semiconductor Physics, National Ukrainian Academy of Sciences, 252028, Kiev, UKRAINE
Get access

Abstract

Using PL, PLE, secondary ion mass spectroscopy (SIMS) and EPR investigations we show in this paper that two luminescence bands with different PL excitation spectra exist on the surface of silicon wires in PS.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Canham, L. T., Appl. Phys. Lett. 57 (10), 10461048 (1990).Google Scholar
2. Kanemitsu, Y., Matsumoto, T., Futagi, T., Mimura, H., Jap. J. Appl. Phys. 32, 411414 (1993).Google Scholar
3. Tsai, C., Li, K.H., Kinosky, D.S., Qian, R.Z., Hsu, T.C., Irby, J.T., etc., Appl.Phys.Lett.,60, 1700, (1992).Google Scholar
4. Prokes, S.M., Glembocki, O.J., Berdudez, V.M., and Kaplan, R., Phys.Rev. B 45, 13788 (1992)Google Scholar
5. Kontkiewichz, A.J., Kontkiwicz, A.M., Siejka, J., Sen, S., Nowak, G., Hoff, A.M.,Sakthivel, P., Ahmed, K., Mukherjee, P., Witanachchi, S., Lagowski, J., Appl.Phys.Lett. 65 (11), 14361438 (1994).Google Scholar
6. Stutzman, M., Brandt, M.S., Rosenbauer, M., Weber, J., Fuchs, H.D., Phys. Rev. B, 47 (8), 48064809 (1992).Google Scholar
7. Pickering, C., Beale, M.I.J., Robbins, D.J., Pearton, P.J., and Greef, R., J.Phys. C,17, 6535 (1984).Google Scholar
8. Suzuki, T., Sakai, T., Zhang, L., Nishiyama, Y., Pickering, A. C., Beale, M.I.J., Robbins, D.J., Pearton, P.J., and Greef, R., J.Phys. C,17, 6535Google Scholar
9. Nishikawa, H., Tohmon, R., Ohki, Y., Nagasawa, K., Hama, Y., J. Appl. Phys. 65 (12), 46724678 (1989).Google Scholar
10. Munekuni, S., Yamanaka, T., Shimogaichi, Y., Tohmon, R., Ohki, Y., Nagasawa, K., Hama, Y., J.Appl. Phys. 68 (3), 1212 (1990).Google Scholar
11. Prokes, S.M., Appl. Phys. Lett., 62, 3244 (1993).Google Scholar